J. H. Lim

Seoul National University — South Korea

Physics and Astronomy · Physical Sciences

10h-index339citations24works4.62yr avg
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Research Topics

Magnetic properties of thin films(16), Ferroelectric and Negative Capacitance Devices(11), Semiconductor materials and devices(7), Non-Destructive Testing Techniques(5), Advanced Memory and Neural Computing(3)

Publications24 total

Developing building shape indexes at the city-scale for understanding building energy consumption
Building Simulation Conference proceedings·2025Open Access
Exploring trends and topics in hybrid intelligence using keyword co-occurrence networks and topic modelling
Futures·2025· 1 cited
Exploring knowledge management technologies to enhance sustainability and mitigate technostress from a collaborative perspective
Journal of Knowledge Management·2024· 8 cited
Disruptive technologies for knowledge management: bibliometric review and patent analysis
Kybernetes·2024· 3 cited
Exploring diverse interests of collaborators in smart cities: A topic analysis using LDA and BERT
Heliyon·2024· 11 citedOpen Access
Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation
2023· 5 cited
STT-MRAM Product Reliability and Cross-Talk
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)·2022· 3 cited
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities
2022 IEEE International Reliability Physics Symposium (IRPS)·2022· 11 cited
STT-MRAM: A Robust Embedded Non-Volatile Memory with Superior Reliability and Immunity to External Magnetic Field and RF Sources
Symposium on VLSI Technology·2021· 4 cited
Role of temperature, MTJ size and pulse-width on STT-MRAM bit-error rate and backhopping
Solid-State Electronics·2021· 5 cited
Advanced MTJ Stack Engineering of STT-MRAM to Realize High Speed Applications
2020· 20 cited
JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications
2020· 43 cited
A Reliable TDDB Lifetime Projection Model Verified Using 40Mb STT-MRAM Macro at Sub-ppm Failure Rate To Realize Unlimited Endurance for Cache Applications
2020· 6 cited
Fast Switching of STT-MRAM to Realize High Speed Applications
2020· 4 cited
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production
2020· 13 cited
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM
2020· 8 cited
Manufacturable 22nm FD-SOI Embedded MRAM Technology for Industrial-grade MCU and IOT Applications
2019· 69 cited
Superior Endurance Performance of 22-nm Embedded MRAM Technology
2019· 8 cited
Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions
2019· 6 cited
Investigating the Statistical-Physical Nature of MgO Dielectric Breakdown in STT-MRAM at Different Operating Conditions
2018· 18 citedOpen Access
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Frequent Co-authors

V. B. Naik(18), K. Yamane(15), J. Kwon(15), N. L. Chung(14), Chao Ren(13), T. Ling(12), J. W. Ting(11), C. S. Seet(11), Yuan You(11), S. Y. Siah(11), Seonhee Jang(11), L. Zhang(10), D. Zeng(9), N. Balasankaran(9), L. Y. Hau(9), L. C. Goh(8), J. Hwang(8), R. Löw(8), S. T. Woo(8), Naganivetha Thiyagarajah(8)