R.S. Tupuri

Advanced Micro Devices (Canada) — Canada

Computer Science · Physical Sciences

5h-index184citations12works0.02yr avg
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Research Topics

VLSI and Analog Circuit Testing(8), Low-power high-performance VLSI design(5), Integrated Circuits and Semiconductor Failure Analysis(4), Embedded Systems Design Techniques(3), Formal Methods in Verification(2)

Publications12 total

A Robust Top-Down Dynamic Power Estimation Methodology for Delay Constrained Register Transfer Level Sequential Circuits
2008· 4 cited
Delay Constrained Register Transfer Level Dynamic Power Estimation
Lecture notes in computer science·2006· 1 cited
Design Migration Across Technology - Making It Work
2005· 1 cited
Session details: Tools and methods for the verification of processors and processor-based systems
Design Automation Conference·2005
A comprehensive fault model for deep submicron digital circuits
2003· 5 cited
A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages
Journal of Electronic Testing·2003· 22 cited
A low-voltage metal-programmable SRAM compiler for gate array
2003
A novel hierarchical test generation method for processors
2002· 7 cited
A novel functional test generation method for processors using commercial ATPG
2002· 82 cited
Timing verification and delay test generation for hierarchical designs
2002· 5 cited
Hierarchical test generation for systems on a chip
2002· 8 cited
Test generation for Gigahertz processors using an automatic functional constraint extractor
1999· 49 cited

Frequent Co-authors

Jacob A. Abraham(9), Arun Krishnamachary(3), Sriram Sambamurthy(2), Vivekananda Vedula(1), Jayanta Bhadra(1), D.G. Saab(1), S. De Sirkar(1), C.S. Madhuri(1), G. Rajagopalan(1), Kapil Mehta(1), C.G. Madhukar(1), G. Bajpe(1), F. Svejda(1), S. Madhuri(1), R. Rath(1), Avi Ziv(1), Erich Marschner(1)