Frederick Duewer

Physics and Astronomy · Physical Sciences

5h-index236citations14works0.02yr avg

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Research Topics

Advanced X-ray Imaging Techniques(9), X-ray Spectroscopy and Fluorescence Analysis(5), Electron and X-Ray Spectroscopy Techniques(4), Advanced X-ray and CT Imaging(4), Near-Field Optical Microscopy(4)

Publications14 total

Microscopy and Microanalysis·2007· 1 cited
AIP conference proceedings·2007· 7 cited
Non Destructive 3D X-Ray Imaging of Nano Structures & Composites at Sub-30 NM Resolution, With a Novel Lab Based X-Ray Microscope
2006
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2005· 4 cited
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2004· 5 cited
A Novel X-ray Microtomography System with High Resolution and Throughput
TechConnect Briefs·2004· 5 cited
Proceedings - International Symposium for Testing and Failure Analysis·2002· 7 cited
Quantitative evanescent microwave microscopy
2000
Nondestructive Imaging of Periodic Structures of Dielectric Constant and Ferroelectric Domains by a Scanning Tip Microwave Near-field Microscope
APS March Meeting Abstracts·1997
Low Temperature Scanning Tip Microwave Near-field Microscopy of YBa_2Cu_3O_7-x Films
APS March Meeting Abstracts·1997
Sub-micron Non-contact Conductivity and Dielectric Constant Imaging by Scanning Near Field Microwave Microscope
APS March Meeting Abstracts·1997

Frequent Co-authors

Wenbing Yun(7), Michael Feser(6), Gung-Chian Yin(3), Yen‐Fang Song(3), Mau‐Tsu Tang(3), Fu‐Rong Chen(3), Keng S. Liang(3), David A. Scott(3), X.‐D. Xiang(3), Han‐Ping D. Shieh(2), Steve Wang(2), S. Kamath(2), Alan Lyon(2), W. Yun(2), Peter G. Schultz(2), Tao Wei(2), Chen-Hao Ko(1), Christopher V. Kelly(1), K. W. Nill(1), David Trapp(1)