Vincent Revol

Swiss Center for Electronics and Microtechnology (Switzerland)Switzerland

Physics and Astronomy · Physical Sciences

16h-index929citations44works1.72yr avg

Accepting Students?

No reports yet. Know if this professor is taking students?


Research Topics

Advanced X-ray Imaging Techniques(27), X-ray Spectroscopy and Fluorescence Analysis(10), Nuclear Physics and Applications(9), Advanced X-ray and CT Imaging(8), Optical measurement and interference techniques(6)

Publications44 total

Frontiers in Bioengineering and Biotechnology·2024· 7 citedOpen Access
Zenodo (CERN European Organization for Nuclear Research)·2022Open Access
Composites Part A Applied Science and Manufacturing·2021· 9 citedOpen Access
Elsevier eBooks·2019
Elsevier eBooks·2019· 20 cited
Nondestructive Testing of Single Crystal Alloy by X-ray Diffraction
2018
SLAS TECHNOLOGY·2018· 2 citedOpen Access
Microcrack characterization in loaded CFRP laminates using quantitative two- and three-dimensional X-ray dark-field imaging Part A Applied science and manufacturing
Composites·2018
58th AIAA/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference·2017· 21 cited
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2016Open Access
page 1 of 3Next →

Frequent Co-authors

Christian Kottler(18), R. Kaufmann(18), C. Urban(14), Iwan Jerjen(8), U. Sennhauser(8), Bernhard Plank(6), Johann Kastner(6), F. Cardot(6), Thomas Lüthi(5), Philippe Niedermann(5), Gilles Weder(5), Thomas Valentin(5), A. Neels(3), Sascha Senck(3), Michael Scheerer(3), Christian Hannesschläger(3), Alex Dommann(3), Matthieu Grésil(3), Konstantinos Kitsianos(3), G. N. Kanderakis(3)