Philips (Netherlands) — Netherlands
Engineering · Physical Sciences
10h-index492citations18works0.02yr avg
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Research Topics
Surface Roughness and Optical Measurements(10), Advanced Surface Polishing Techniques(7), Cultural Heritage Materials Analysis(5), Rare-earth and actinide compounds(4), Electron and X-Ray Spectroscopy Techniques(4)
Publications18 total
X-Ray Spectrometry·1995· 68 cited
Applied Physics A·1995· 8 cited
Applied Physics A·1995· 1 cited
Journal de Physique III·1994· 17 citedOpen Access
Surface and Interface Analysis·1994· 12 cited
Applied Physics A·1994· 15 cited
Journal of Magnetism and Magnetic Materials·1993· 9 cited
Spectrochimica Acta Part B Atomic Spectroscopy·1993· 37 cited
Materials science forum·1993· 1 cited
Springer proceedings in physics·1992· 2 cited
Spectrochimica Acta Part B Atomic Spectroscopy·1991· 55 cited
Advances in X-ray Analysis·1991· 2 cited
Advances in X-ray Analysis·1990· 10 cited
Journal of the Less Common Metals·1980· 17 cited
Journal of Magnetism and Magnetic Materials·1979· 25 cited
Journal of the Less Common Metals·1976· 162 cited
Journal of the Less Common Metals·1976· 50 cited
Frequent Co-authors
Dick K. G. de Boer(9), A. Leenaers(4), K.H.J. Buschow(2), J.H.N. van Vucht(2), K.H.J. Buschow(2), Dick K. G. de Boer(2), J. Kuběna(2), T W Ryan(1), V. Holý(1), I. Vávra(1), V. Hol�(1), I. V�vra(1)