Jonathan A. Zimmerman

Technion – Israel Institute of TechnologyIsrael

Materials Science · Physical Sciences

33h-index5.2kcitations241works2.22yr avg

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Research Topics

Microstructure and mechanical properties(68), Metal and Thin Film Mechanics(35), Force Microscopy Techniques and Applications(19), Advanced Semiconductor Detectors and Materials(15), High-Velocity Impact and Material Behavior(14)

Publications241 total

Acta Materialia·2025· 2 citedOpen Access
Acta Materialia·2024· 2 cited
Scripta Materialia·2024· 4 citedOpen Access
International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde)·2024
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)·2023Open Access
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)·2023Open Access
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Frequent Co-authors

Xiaowang Zhou(12), Reese E. Jones(8), Bryan M. Wong(8), Lucas Michael Hale(7), David L. McDowell(5), D. K. Ward(5), Stephen M. Foiles(4), Harold S. Park(4), N. R. Moody(4), F. Patrick Doty(4), Patrick Klein(3), Ken Gall(3), Huajian Gao(3), Christopher R. Weinberger(3), Jeremy Alan Templeton(3), Garritt J. Tucker(3), J. C. Hamilton(2), J.J. Hoyt(2), William D. Nix(2), E.D. Reedy(2)