R. Lüthi

IBM Research - Zurich — Switzerland

Physics and Astronomy · Physical Sciences

30h-index3.5kcitations68works0.02yr avg
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Research Topics

Force Microscopy Techniques and Applications(62), Mechanical and Optical Resonators(38), Adhesion, Friction, and Surface Interactions(15), Surface and Thin Film Phenomena(11), Acoustic Wave Resonator Technologies(8)

Publications68 total

Direct Determination of the Energy Required to Operate a Single Molecule Switch
Physical Review Letters·2003· 190 cited
Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu(100) observed with a combined AFM/STM
Applied Physics A·2001· 19 cited
Dynamic force microscopy across steps on the Si(111)-(7×7) surface
Surface Science·2000· 51 cited
Tribological experiments with friction force microscopy
Elsevier eBooks·2000· 2 cited
Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy
Ferroelectrics·1999· 70 cited
Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy
Applied Surface Science·1999· 35 cited
New Developments in Scanning Probe Microscopy
1999· 1 cited
Resolution Limits of Force Microscopy
ACS symposium series·1998· 3 cited
Comparison of dynamic lever STM and noncontact AFM
Applied Physics A·1998· 30 cited
Surface potential studies using Kelvin force spectroscopy
Applied Physics A·1998· 15 cited
Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers
Applied Physics A·1998· 78 cited
Dynamic SFM with true atomic resolution on alkali halide surfaces
Applied Physics A·1998· 89 cited
Combined scanning tunneling and force microscope with fuzzy controlled feedback
Applied Physics A·1998· 4 cited
Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope
Applied Physics Letters·1998· 27 cited
Forces in Scanning Probe Microscopy
1998· 2 cited
ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION
Surface Review and Letters·1997· 62 cited
Atomare Auflösung auf einem Isolator mittels Rasterkraftmikroskopie
Physikalische Blätter·1997· 3 citedOpen Access
Instrumental Aspects and Contrast Mechanisms of Friction Force Microscopy
1997· 7 cited
Friction force microscopy on well defined surfaces
Nanotechnology·1996· 13 cited
A nanoscopic view of structure and deformation of hard elastic polypropylene with scanning force microscopy
Journal of Polymer Science Part B Polymer Physics·1996· 45 cited
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Frequent Co-authors

Ernst Meyer(44), L. Howald(26), M. Bammerlin(18), H. Haefke(17), H.‐J. Güntherodt(16), H.‐J. Güntherodt(15), Martin Guggisberg(15), René M. Overney(11), Jane Frommer(11), H.‐J. Güntherodt(6), A. Baratoff(6), W. Gutmannsbauer(5), Ch. Loppacher(5), Christian Loppacher(5), F. Battiston(5), L. Scandella(5), D. Brodbeck(4), Masamichi Fujihira(4), K.-P. Meyer(4), H.-J. Güntherodt(4)