Weilun Chao

Lawrence Berkeley National Laboratory — United States

Physics and Astronomy · Physical Sciences

30h-index4.3kcitations258works0.72yr avg
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Research Topics

Advanced X-ray Imaging Techniques(122), Advancements in Photolithography Techniques(69), Advanced Electron Microscopy Techniques and Applications(67), Electron and X-Ray Spectroscopy Techniques(38), X-ray Spectroscopy and Fluorescence Analysis(37)

Publications258 total

Pattern-enhanced Resonant Soft X-ray Scattering for Operando monitoring of electrochemical solid-liquid interfaces
Nature Communications·2026Open Access
Terrace‐Edge‐Induced Domain Nucleation in Room‐Temperature 2D Magnetic Van Der Waals Heterostructures
Advanced Functional Materials·2025Open Access
Navigating the research landscape for hyper-NA EUV lithography and future patterning technologies
2025
BeetleFlow: An Integrative Deep Learning Pipeline for Beetle Image Processing
arXiv (Cornell University)·2025Open Access
BioCAP: Exploiting Synthetic Captions Beyond Labels in Biological Foundation Models
arXiv (Cornell University)·2025Open Access
Binary pseudo random array standard for EUV lithography tool characterization
2025
Demonstration of a dual-beam zone plate for phase-contrast coherent soft x-ray imaging
2025
Binary pseudo-random array for transfer function calibration of interferometers with transmission spheres and cylinders
2025
Low-Power Branch CNN Hardware Accelerator with Early Exit for UAV Disaster Detection Using 16 nm CMOS Technology
Sensors·2025Open Access
Finer-CAM: Spotting the Difference Reveals Finer Details for Visual Explanation
2025· 8 cited
AVA-Bench: Atomic Visual Ability Benchmark for Vision Foundation Models
arXiv (Cornell University)·2025Open Access
Characterization of latent image of resist materials via critical-dimension resonant soft x-ray scattering
2025
Using a FEM-based Maxwell solver and CD-RSoXS measurement for the analysis of photoresist pattern
2025
Mask-side Hyper-NA EUV imaging on the SHARP microscope
Journal of Micro/Nanopatterning Materials and Metrology·2025Open Access
Revisiting semi-supervised learning in the era of foundation models
arXiv (Cornell University)·2025Open Access
Building Machine Learning Challenges for Anomaly Detection in Science
ArXiv.org·2025Open Access
Mixed Signals: A Diverse Point Cloud Dataset for Heterogeneous LiDAR V2X Collaboration
arXiv (Cornell University)·2025Open Access
Finer-CAM: Spotting the Difference Reveals Finer Details for Visual Explanation
arXiv (Cornell University)·2025Open Access
Characterization of latent image of electron beam resist via critical-dimension resonant soft X-ray scattering
Journal of Micro/Nanopatterning Materials and Metrology·2024Open Access
Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics
2024· 1 citedOpen Access
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Frequent Co-authors

Erik H. Anderson(21), David Attwood(11), Peter Fischer(11), Carmen S. Menoni(10), J. J. Rocca(9), Patrick Naulleau(8), Margaret M. Murnane(6), Henry C. Kapteyn(6), Mi‐Young Im(6), F. Brizuela(6), M. C. Marconi(6), B. Harteneck(5), Senajith Rekawa(5), Jorge N. Hernández-Charpak(5), Travis D. Frazer(5), Deirdre L. Olynick(5), J. Alexander Liddle(5), P. Wachulak(5), C. Brewer(5), Erik Anderson(5)