Teong-San Yeoh

Intel (Malaysia) — Malaysia

Engineering · Physical Sciences

5h-index80citations15works0.02yr avg
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Research Topics

Semiconductor materials and devices(10), Advancements in Semiconductor Devices and Circuit Design(8), Integrated Circuits and Semiconductor Failure Analysis(4), Electrostatic Discharge in Electronics(3), Silicon Carbide Semiconductor Technologies(2)

Publications15 total

ESD equivalent circuits and simulations-effects on gate oxide breakdown/degradation
2002
Wafer fabrication ion implant charging-impact on gate oxide breakdown
2002
Novel cell isolation technique for the analysis of CMOS SRAM cell cold failure
2002· 3 cited
Influence of MOS transistor gate oxide breakdown on circuit performance
2002· 9 cited
ESD effects on power supply clamps [CMOS ICs]
2002· 1 cited
Building in reliability during ESD design layout
2002· 1 cited
MOS transistor gate oxide breakdown stress dependence and their related models
2002· 6 cited
A new oxide breakdown degradation phenomenon in CMOS transistors
2002· 1 cited
Reliability assessment of EPROM memory retention for wafer level sort programming
2002
Wafer level sort programming-impact on EPROM memory retention
IEEE Transactions on Semiconductor Manufacturing·1996
Gate Oxide Breakdown Model in MOS Transistors
1995· 18 cited
Gate oxide breakdown model in MOS transistors
1995· 23 cited
Structure of dichloro[1-(4-methoxyphenyl)iminomethyl-2-naphtholato]diphenyltin(IV)
Acta Crystallographica Section C Crystal Structure Communications·1991· 3 cited
X-Ray Structure Investigation of Single Crystals of SnTe Doped with the Various 3<i>d</i>Transition Elements of Cr, Mn, Fe, Co and Ni
Journal of the Physical Society of Japan·1988· 13 cited
Tetraalkylammonium Bromochlorocuprates(II)
Australian Journal of Chemistry·1979· 2 cited

Frequent Co-authors

Shze-Jer Hu(7), R.S. Nair(2), S.G. Teoh(2), Hoong‐Kun Fun(2), Shze-Jer Hu(2), N.R. Kamat(1), Nitin R. Kamat(1), Remesh S. Nair(1), S. B. Teo(1), Guan‐Yeow Yeap(1), Yit-Wooi Lim(1), DW Smith(1), Kean-Hong Aw(1)