Michael K. Trubetskov

Max Planck Institute of Quantum Optics — Germany

Materials Science · Physical Sciences

36h-index4.7kcitations307works1.22yr avg
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Research Topics

Optical Coatings and Gratings(103), Advanced Fiber Laser Technologies(74), Surface Roughness and Optical Measurements(67), Laser-Matter Interactions and Applications(62), Semiconductor Lasers and Optical Devices(43)

Publications307 total

Optical dispersion and band gap of Silicon-SiO <sub>2</sub> quantizing nanolaminates
Applied Optics·2025
Smart color designs with Ag and Au metal island films: a theoretical study
Applied Optics·2025
Optical interference coating design challenge 2025: a design for production and an immersed, three-line, polarizing notch filter [Invited]
Applied Optics·2025
Octave-Spanning Mid-Infrared Electric Field-Resolved Molecular Fingerprinting of Human Blood Plasma
2025
Electric-Field Molecular Fingerprinting to Probe Cancer
ACS Central Science·2025· 6 citedOpen Access
Characterization of PARMS Produced 1-μm thick Ta2O5 and SiO2 Monolayers in 0.35-5 μm Spectral Range
2025
OIC 2025 - Design Challenge Results
2025
Smart Color Designs with Ag and Au Metal-Island Films
2025
Reliable Characterization of SK-1300, MgF2, ZnSe, and Si Substrates in 0.2-4.2 μm Spectral Range
2025
Optical characterization of Si-SiO2 quantizing nanolaminates
2025
Standardized Electric-Field-Resolved Molecular Fingerprinting
Analytical Chemistry·2024· 4 citedOpen Access
Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data
2024
Advanced characterization of IBAD deposited MgF2, Al2O3, Si, YF3, and Ge thin films in ultra-broadband spectral region of 300-5000 nm
2024
Post-production characterization of double-sided ZnS/YbF3 mid-infrared thin-film optical elements
2024
Optimizing thin-film material combinations for immersed narrow-bandpass filters in the VIS and NIR range
2024· 1 cited
Reliable post-production characterization of TiO2/SiO2 electron-beam optical coatings based on multi-sample photometric and ellipsometric data
2024
Dual-oscillator infrared electro-optic sampling with attosecond precision
Optica·2024· 10 citedOpen Access
Influence of fitting algorithms on thickness determination during monitoring of optical coatings
Surface and Coatings Technology·2023· 5 cited
Standardising Electric-Field-Resolved Molecular Fingerprints
2023· 1 cited
Dual-Oscillator Field-Resolved Infrared Spectroscopy with Individual-Scan Referencing
2023
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Frequent Co-authors

Alexander V. Tikhonravov(32), Tatiana V. Amotchkina(17), Ferenc Krausz(14), Vladimir Pervak(9), Vladimir Pervak(9), V. Pervak(6), Oleg Pronin(5), Ioachim Pupeza(4), A. Apolonski(4), Gary W. DeBell(4), Detlev Ristau(4), Marinus Huber(3), Christina Höfer(3), Ernst E. Fill(3), Kosmas V. Kepesidis(3), Mihaela Žigman(3), J. A. Dobrowolski(3), Nikolai Lilienfein(3), Michael A. Kokarev(3), Norbert Kaiser(3)