D. Peyre

Commissariat à l'Énergie Atomique et aux Énergies Alternatives — France

Engineering · Physical Sciences

6h-index145citations13works0.02yr avg
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Research Topics

Radiation Effects in Electronics(11), Semiconductor materials and devices(6), Advancements in Semiconductor Devices and Circuit Design(4), Integrated Circuits and Semiconductor Failure Analysis(4), VLSI and Analog Circuit Testing(2)

Publications13 total

Investigations on the displacement damage dose effects induced by heavy ion irradiation in silicon PiN photodiodes: Implications for modeling and simulation
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms·2019· 1 citedOpen Access
Influence of Beam Conditions and Energy for SEE Testing
IEEE Transactions on Nuclear Science·2012· 38 cited
Influence of beam conditions and energy for SEE testing
2011· 26 cited
Charge Collection in Power MOSFETs for SEB Characterisation—Evidence of Energy Effects
IEEE Transactions on Nuclear Science·2010· 24 cited
In flight observation of proton induced destructive single event phenomena
2009· 18 cited
A simple method for optocouplers selection in the frame of space applications
2009
SEGR Study on Power MOSFETs: Multiple Impacts Assumption
IEEE Transactions on Nuclear Science·2008· 22 cited
SEGR study on Power MOSFETs: Multiple impacts assumption
2007· 3 cited
First observation of Single Event Dielectric Rupture on OP400 operational amplifier
HAL (Le Centre pour la Communication Scientifique Directe)·2006· 1 cited
Radiation characterization and test methodology study of optocouplers devices for space applications
2005· 12 cited
Commercial components identification in naturally radiation hardened technologies
2002
Semi-permanent effects induced by an ionizing pulse in a MOS structure: experimental and theoretical study
IEEE Transactions on Nuclear Science·1992
IONIZING PULSE IN A MOS STRUCTURE : EXPERIMENTAL AND THEORETICAL STUDY
1992

Frequent Co-authors

F. Bezerra(7), C. Binois(6), Guy Berger(4), B. Piquet(4), Jean-Claude Foy(4), R. Mangeret(4), E. Lorfèvre(4), C. Poivey(3), R. Harboe-Sørensen(3), G. Santin(3), P.R. Truscott(3), Marc Poizat(3), T. Beutier(3), Fredrik Sturesson(3), R. Ecoffet(3), Ch. Poivey(3), G. Salvaterra(3), Matthieu Beaumel(3), Thierry Bouchet(3), M. Muschitiello(2)