J. Politch

Technion – Israel Institute of Technology — Israel

Computer Science · Physical Sciences

8h-index296citations66works0.02yr avg
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Research Topics

Optical measurement and interference techniques(26), Advanced Measurement and Metrology Techniques(20), Advanced Optical Imaging Technologies(10), Digital Holography and Microscopy(10), Gyrotron and Vacuum Electronics Research(8)

Publications66 total

US Backscattered Detection of Layered Soft Tissues
American Journal of Biomedical Science & Research·2024Open Access
Optimal parameters for the enhancement of human osteoblast-like cell proliferation in vitro via shear stress induced by high-frequency mechanical vibration
Iberoamerican Journal of Medicine·2021· 5 citedOpen Access
Optimal parameters for the enhancement of human osteoblast-like cell proliferation in vitro via shear stress induced by high-frequency mechanical vibration
SHILAP Revista de lepidopterología·2021Open Access
Use of storage phosphor imaging plates in portal imaging and high‐energy radiography: The intensifying effect of metallic screens on the sensitivity
Medical Physics·1991· 13 cited
Second-order phenomena in strain measurement by speckle techniques
Optics and Lasers in Engineering·1991· 1 cited
Spectroscopic holography: a new method for mode analysis of randomly excited structures
Journal of the Optical Society of America A·1990· 5 cited
Variation in displacement values along projection moire fringes in contour difference and vibration analysis of structures
Optical Engineering·1990
Variation in displacement values along projection moire fringes in contour difference and vibration analysis of structures
Optical Engineering·1990· 6 cited
Infrastructure of time-averaged projection moire fringes in vibration analysis
Applied Optics·1989· 15 cited
Optical Neasurements Of Diamond-Turned Surfaces
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1989
Moire Methods For Curvature Measurements
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1989
Profilometry In The Angstrom Region
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1989
Second derivative of displacement on cylindrical shells by projection moire
Applied Optics·1989· 4 cited
Derivatives in speckle shearing interferometry. Part 1: Theoretical considerations
Optics and Lasers in Engineering·1989
Curvature And Strain Variations By Rasterography
Optical Engineering·1988· 1 cited
Influence of a converging incident beam and variations in the surface complex index of refraction on optical profilometric measurements
Applied Optics·1988
Interpretation of the millimeter wave generation in the orbitron as stimulated emission of bremsstrahlung
International Journal of Infrared and Millimeter Waves·1987· 3 cited
Processing & Analyzing The Curvature And Strain Variations By Close - Range Moire Photogrammetry
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1987
Heterodyne profiling instrument for the angstrom region
Applied Optics·1986· 47 cited
Heterodyne Interferometer For Surface Profile Measurements In The Angstrom Region
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1986
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Frequent Co-authors

A. Rosenberg(10), J. Felsteiner(9), Y. Ben-Aryeh(6), A. Assa(3), A. Betser(3), Joseph Shamir(3), J. Ben Uri(3), Michael Segal(3), Dan Pantzer(2), P. Hopstone(2), A. Katz(2), R. Opher(2), N.H. Farhat(2), S. Gryc(2), Leif Ek(1), G. Barnea(1), E. Navon(1), A. Ginzburg(1), Hans Roehrig(1), C. E. Dick(1)