Tobias Koal

Brandenburg University of Technology Cottbus-Senftenberg — Germany

Engineering · Physical Sciences

9h-index238citations36works0.02yr avg
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Research Topics

Radiation Effects in Electronics(26), VLSI and Analog Circuit Testing(25), Semiconductor materials and devices(17), Integrated Circuits and Semiconductor Failure Analysis(17), Embedded Systems Design Techniques(5)

Publications36 total

A comprehensive software-based self-test and self-repair method for statically scheduled superscalar processors
2016· 4 cited
Correcting Delay Faults and Transient Faults in Pipelines
2015
Exploring diagnostic capabilities of software-based self-tests for production and in-field applications
2015· 1 cited
Redundancy evaluation process of processor components for permanent fault compensation
2015
Combining Correction of Delay Faults and Transient Faults
2015· 1 cited
A multi-layer software-based fault-tolerance approach for heterogenous multi-core systems
2015· 1 cited
On reliability estimation for combined transient and permanent fault handling
2014· 4 cited
Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults
2014· 6 cited
Timing for virtual TMR in logic circuits
2014· 4 cited
Reconfigurable high performance architectures: How much are they ready for safety-critical applications?
2014· 12 cited
Systematic generation of diagnostic software-based self-test routines for processor components
2014· 11 cited
Combining fault tolerance and self repair at minimum cost in power and hardware
2014· 7 cited
Built-In Self Repair for Logic Structures
Nanotechnology·2014
On performance estimation of a scalable VLIW soft-core on ALTERA and XILINX FPGA platforms
International Conference on Applied Electronics·2013· 6 cited
Virtual TMR Schemes Combining Fault Tolerance and Self Repair
2013· 11 cited
On performance estimation of a scalable VLIW soft-core in XILINX FPGAs
2013· 5 citedOpen Access
Towards an automatic generation of diagnostic in-field SBST for processor components
2013· 8 cited
On the feasibility of combining on-line-test and self repair for logic circuits
2013· 14 cited
Activity Migration in M-of-N-Systems by Means of Load-Balancing
2012
Combining on-line fault detection and logic self repair
2012· 5 cited
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Frequent Co-authors

H.T. Vierhaus(36), Mario Schölzel(15), Daniel Scheit(6), Stefan Scharoba(6), Markus Ulbricht(5), Sebastian Müller(3), Stephanie Roder(2), Petr Pfeifer(2), Zdeněk Plíva(2), P. Engelke(1), D. Sabena(1), Luca Sterpone(1), Stephan Wong(1), R. Glein(1), Florian Rittner(1), Christopher Stender(1), Mario Porrmann(1), Jens Hagemeyer(1), Christian Gleichner(1)