Y. Gerbig

National Institute of Standards and Technology — United States

Engineering · Physical Sciences

23h-index1.7kcitations73works2.02yr avg
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Research Topics

Metal and Thin Film Mechanics(34), Diamond and Carbon-based Materials Research(27), Advanced Surface Polishing Techniques(23), Force Microscopy Techniques and Applications(13), Adhesion, Friction, and Surface Interactions(12)

Publications73 total

Raman spectroscopic measurements and imaging on sub-newton Berkovich and spherical imprints in fused silica
Journal of Non-Crystalline Solids·2024· 2 citedOpen Access
A static stiffness reference object for instrumented indentation with integrated fiber Fabry–Perot displacement measuring interferometer
Measurement Science and Technology·2023· 2 citedOpen Access
In-situ Raman spectroscopic measurements of the deformation region in indented glasses
Journal of Non-Crystalline Solids·2019· 16 citedOpen Access
Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopy
Journal of Applied Physics·2017· 11 citedOpen Access
In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films
Scripta Materialia·2016· 18 cited
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si
Ultramicroscopy·2016· 20 citedOpen Access
Assessing Electron Backscattered Diffraction and Confocal Raman Microscopy Strain Mapping Using Wedge-indented Si
Ultramicroscopy·2016
<i>In situ</i>spectroscopic study of the plastic deformation of amorphous silicon under nonhydrostatic conditions induced by indentation
Physical Review B·2015· 31 citedOpen Access
In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films
Journal of materials research/Pratt's guide to venture capital sources·2014· 29 cited
Raman Spectroscopy-Enhanced IIT: In Situ Analysis of Mechanically Stressed Polycrystalline Si Thin Films
River Publishers eBooks·2014· 1 cited
In Situ Analysis of Materials Under Mechanical Stress: A Novel Instrument for Simultaneous Nanoindentation and Raman Spectroscopy
2014
Accurate spring constant calibration for very stiff atomic force microscopy cantilevers
Review of Scientific Instruments·2013· 15 cited
Stress-Intensity Factor and Toughness Measurement at the Nanoscale using Confocal Raman Microscopy
Gruppo Italiano Frattura Digital Repository (Gruppo Italiano Frattura)·2013Open Access
In situ Analysis of Materials Under Mechanical Stress: A Novel Instrument for Simultaneous Nanoindentation and Raman Spectroscopy
Imaging and Applied Optics·2013· 2 cited
Indentation device for <i>in situ</i> Raman spectroscopic and optical studies
Review of Scientific Instruments·2012· 24 cited
High Confidence Level Calibration for AFM Based Fracture Testing of Nanobeams
River Publishers eBooks·2012
The role of tooth enamel mechanical properties in primate dietary adaptation
American Journal of Physical Anthropology·2012· 46 citedOpen Access
<i>In situ</i>observation of the indentation-induced phase transformation of silicon thin films
Physical Review B·2012· 65 cited
In situ observation of the indentation-induced phase transformation of silicon thin films | NIST
2012
Direct observation of phase transformation anisotropy in indented silicon using confocal Raman microscopy | NIST
Physical Review Letters·2011
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Frequent Co-authors

H. Haefke(23), Robert F. Cook(15), Chris A. Michaels(9), G. Dumitru(8), Valerio Romano(8), Luca Valentini(7), J. M. Kenny(7), H. P. Weber(5), Jörg Hermann(5), Mark D. Vaudin(5), Alan Savan(5), S. Bruneau(4), Andrea Di Schino(4), D.G. Chetwynd(4), L. Lozzi(4), S. Santucci(4), Stephan J. Stranick(3), Aaron M. Forster(3), M. Sentís(3), Gheorghe Stan(3)