C. Monsérie

Centre National de la Recherche Scientifique — France

Engineering · Physical Sciences

5h-index84citations11works0.02yr avg
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Research Topics

Semiconductor materials and devices(11), Advancements in Semiconductor Devices and Circuit Design(9), Integrated Circuits and Semiconductor Failure Analysis(7), Advanced Memory and Neural Computing(2), Advanced ceramic materials synthesis(1)

Publications11 total

Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies
Microelectronics Reliability·2004· 2 cited
Improved methodology based on hot carriers injections to detect wafer charging damage in advanced CMOS technologies
2004
Comparison of oxide leakage currents induced by ion implantation and high field electric stress
Solid-State Electronics·2001· 9 cited
On the charge build-up mechanisms in gate dielectrics
Solid-State Electronics·1994· 37 cited
Reliability issues of silicon-dioxide structures—Application to FLOTOX EEPROM cells
Microelectronics Reliability·1993· 5 cited
Comparative study of hot-carrier degradation in p + and n + poly p-MOSFET's of a 0.5 μm CMOS technology
European Solid-State Device Research Conference·1993· 2 cited
Reliability issues of offset drain transistors after different modes of static electrical stress
Microelectronics Reliability·1993
Temperature, field and technological dependences of thin oxide breakdown characteristics
Microelectronics Journal·1993· 7 cited
Reliability issues of offset drain transistors after different modes of electrical stress
Quality and Reliability Engineering International·1993
Breakdown characteristics of gate and tunnel oxides versus field and temperature
Quality and Reliability Engineering International·1993· 11 cited
Correlation between negative bulk oxide charge and breakdown: modeling, and new criteria for dielectric quality evaluation
1993· 11 cited

Frequent Co-authors

G. Ghibaudo(7), G. Pananakakis(7), P. Mortini(6), C. Papadas(5), D. Goguenheim(3), A. Bravaix(3), Jean-Michel Moragues(3), P. Boivin(3), S. Gomri(2), N. Legrand(2), F. Pio(1), Carlo Riva(1), C. Gounelle(1), Patrick Lambert(1), R. Bellens(1), G. Groeseneken(1), H.E. Maes(1)