National Institute of Standards and Technology — United States
Engineering · Physical Sciences
17h-index932citations113works0.02yr avg
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Research Topics
Advanced Measurement and Metrology Techniques(55), Optical measurement and interference techniques(39), Surface Roughness and Optical Measurements(27), Optical Coatings and Gratings(21), Calibration and Measurement Techniques(15)
Publications113 total
Surface Topography Metrology and Properties·2024Open Access
Optical Engineering·2023Open Access
Fourier Transform Spectroscopy·2022· 11 cited
Journal of Research of the National Institute of Standards and Technology·2020Open Access
Optics Express·2019· 2 citedOpen Access
Optical Engineering·2018· 6 citedOpen Access
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2016· 14 citedOpen Access
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2016· 9 cited
Xgremlin: Interferograms and spectra from Fourier transform spectrometers analysis
Astrophysics Source Code Library·2015· 7 cited
Interferometric measurement of large sphere radii using holograms | NIST
2015
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Frequent Co-authors
Quandou Wang(14), Johannes A. Soons(7), John H. Burnett(7), Rajeev Gupta(6), Gillian Nave(6), M A Baig(5), B. Esser(4), J. Hormes(3), Rainer Kling(2), J P Connerade(2), Łukasz Bratasz(2), Krzysztof Dzierżȩga(2), Józef Musielok(2), W. L. Wiese(2), S. Ahmad(2), Jiyoung Chu(2), Guangjun Gao(2), Qian Gong(2), Margaret Z. Dominguez(2), John G. Hagopian(2)