Robert A. Wolkow

University of Alberta — Canada

Physics and Astronomy · Physical Sciences

47h-index8.5kcitations209works6.12yr avg
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Research Topics

Surface and Thin Film Phenomena(74), Molecular Junctions and Nanostructures(71), Force Microscopy Techniques and Applications(64), Semiconductor materials and devices(44), Quantum and electron transport phenomena(38)

Publications209 total

Quantum technology: prospects for new thermometric and radiometric sensor development
Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences·2026Open Access
Ultrafast Terahertz Dynamics of Dangling Bonds on the Si(100)-2x1 Surface
2025
Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling Microscopy
ACS Nano·2025
A comparative STM investigation of hydrogen, oxygen, and air plasma pretreatments for reduced-temperature (1050 °C) flash annealing of silicon (100) substrates
Vacuum·2025
Structural Control of Atomic Silicon Wires
ACS Nano·2025Open Access
Electronic structures of atomic silicon dimer wires as a function of length
Nanotechnology·2025· 2 citedOpen Access
Roadmap on atomic-scale semiconductor devices
Nano Futures·2025· 13 citedOpen Access
Roadmap on Atomic-scale Semiconductor Devices
arXiv (Cornell University)·2025· 1 citedOpen Access
Electronic Structures of Atomic Silicon Dimer Wires as a Function of Length
arXiv (Cornell University)·2024Open Access
Towards Atomic Defect-Aware Physical Design of Silicon Dangling Bond Logic on the H -Si $(100)-2\times 1$ Surface
2024· 1 cited
Atomically Precise Manufacturing of Silicon Electronics
ACS Nano·2024· 51 citedOpen Access
Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness
IEEE Transactions on Nanotechnology·2024· 5 cited
Atomic Defect-Aware Physical Design of Silicon Dangling Bond Logic on the H-Si(100)2x1 Surface
arXiv (Cornell University)·2023· 1 citedOpen Access
Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness
arXiv (Cornell University)·2022Open Access
Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope
ACS Nano·2021· 7 cited
Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM
Ultramicroscopy·2021· 2 cited
Consistent probe spacing in multi-probe STM experiments
AIP Advances·2020· 2 citedOpen Access
Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy
Beilstein Journal of Nanotechnology·2020· 20 citedOpen Access
Deep learning-guided surface characterization for autonomous hydrogen lithography
Machine Learning Science and Technology·2020· 28 citedOpen Access
Atomic Defects of the Hydrogen-Terminated Silicon Surface Imaged with nc-AFM
NPARC·2020
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Frequent Co-authors

Jason Pitters(14), Gregory P. Lopinski(11), Douglas J. Moffatt(9), Lucian Livadaru(9), Gino A. DiLabio(8), P. G. Piva(6), Mohammad Rashidi(6), D. D. M. Wayner(5), Roshan Achal(5), Taleana Huff(5), Marco Taucer(4), Phaedon Avouris(3), Werner A. Hofer(3), Martin Cloutier(3), S. N. Patitsas(3), Mark Salomons(3), Konrad Walus(3), Moh’d Rezeq(2), Erin R. Johnson(2), Muhammad Haider(2)