Laboratoire de Physique des Interfaces et des Couches Minces — France
Engineering · Physical Sciences
6h-index286citations11works0.02yr avg
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Research Topics
Optical Polarization and Ellipsometry(10), Optical measurement and interference techniques(5), Optical Coatings and Gratings(5), Surface Roughness and Optical Measurements(3), Leaf Properties and Growth Measurement(3)
Publications11 total
Analysis of textured films and periodic Grating Structures with Mueller Matrices: A new Challenge in Instrumentation with the generation of angle-resolved SE polarimeters
HAL (Le Centre pour la Communication Scientifique Directe)·2011
EPJ Web of Conferences·2010· 2 citedOpen Access
Polarimétrie de Mueller résolue en angle
2009
physica status solidi (a)·2008· 46 cited
physica status solidi (a)·2008· 63 cited
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2007· 19 cited
Journal of the European Optical Society Rapid Publications·2007· 37 citedOpen Access
Applied Optics·2006· 98 cited
Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronics
HAL (Le Centre pour la Communication Scientifique Directe)·2006
Frequent Co-authors
A. De Martino(10), Tatiana Novikova(4), B. Drévillon(3), Martin Foldyna(3), Razvigor Ossikovski(2), Makrina Anastasiadou(2), Clément Fallet(2), C. Vannuffel(2), Enric Garcia‐Caurel(1), Steve Guyot(1), Bicher Haj Ibrahim(1), Christophe Licitra(1), J. Foucher(1), F. Ferrieu(1), F. Ferrieu(1)