R. Gijbels

University of Antwerp — Belgium

Engineering · Physical Sciences

49h-index9.4kcitations322works0.02yr avg
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Research Topics

Ion-surface interactions and analysis(99), Plasma Diagnostics and Applications(98), Mass Spectrometry Techniques and Applications(88), Analytical chemistry methods development(65), Advanced Chemical Physics Studies(40)

Publications322 total

Electron Microscopy, Nanoscopy, and Scanning Micro‐ and NanoanalysisUpdate based on the original article by Vladimir Oleshko, Renaat Gijbels and Severin Amelinckx,<i>Encyclopedia of Analytical Chemistry</i>, © 2000, John Wiley &amp; Sons, Ltd
Encyclopedia of Analytical Chemistry·2013· 3 cited
Modern developments and applications in microbeam analysis. Proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6–10, 2007
Microchimica Acta·2008· 1 cited
On the quasi-random entropy of linear species
Document Server@UHasselt (UHasselt)·2007
Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry
Spectrochimica Acta Part B Atomic Spectroscopy·2007· 43 cited
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings
Applied Surface Science·2006· 3 cited
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)
Applied Surface Science·2006· 11 cited
Influence of electron recapture by the cathode upon the discharge characteristics in dc planar magnetrons
Physical Review E·2005· 44 citedOpen Access
Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma
Journal of Applied Physics·2005· 22 cited
Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements
Journal of Applied Physics·2005· 50 cited
Interpretation of TOF–SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation
Applied Physics A·2005· 6 cited
Matrix‐enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films
Rapid Communications in Mass Spectrometry·2005· 40 cited
Comparative study of organic dyes with time‐of‐flight static secondary ion mass spectrometry and related techniques
Journal of Mass Spectrometry·2005· 6 cited
Hollow cathode discharges with gas flow: numerical modelling for the effect on the sputtered atoms and the deposition flux
Plasma Sources Science and Technology·2005· 12 cited
Molecular dynamics simulation of the impact behaviour of various hydrocarbon species on DLC
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms·2004· 26 cited
Metal-Assisted Secondary Ion Mass Spectrometry:  Influence of Ag and Au Deposition on Molecular Ion Yields
Analytical Chemistry·2004· 86 cited
Incorporating the gas flow in a numerical model of rf discharges in methane
Journal of Applied Physics·2004· 14 cited
ユーザーの立場に立った表面分析の新展開(2)rf-GDOESによるナノ薄膜分析
工業材料·2004
Modeling of dusty silane discharges: nanoparticle formation, transport and charging
APS Annual Gaseous Electronics Meeting Abstracts·2004
Effect of high-frequency electromagnetic field on Te+- implanted (0 0 1) Si
Vacuum·2004· 2 cited
Molecular dynamics simulations for the growth of diamond-like carbon films from low kinetic energy species
Diamond and Related Materials·2004· 59 cited
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Frequent Co-authors

Annemie Bogaerts(32), Jan M. L. Martin(10), J. P. François(10), Ákos Vértes(7), W. J. Goedheer(4), Violeta Georgieva(3), Erik C. Neyts(2), J. Vlček(2), Mark van Straaten(2), Péter Juhász(2), Joost van der Mullen(1), Zhaoyang Chen(1), Fred C. Adams(1), Luc Van Vaeck(1), Annemie Adriaens(1), D. Herrebout(1), Min Yan(1), E.H.A. Dekempeneer(1), Andriy Okhrimovskyy(1), László Balázs(1)