Zhengheng Qing

Huazhong University of Science and Technology — China

Engineering · Physical Sciences

4h-index36citations13works2.32yr avg
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Research Topics

Silicon Carbide Semiconductor Technologies(7), Pulsed Power Technology Applications(6), Electrostatic Discharge in Electronics(4), Electromagnetic Launch and Propulsion Technology(4), Diamond and Carbon-based Materials Research(2)

Publications13 total

Experimental Study on Current Transfer of Hybrid DC Circuit Breaker Based on Reverse Blocking Diode Thyristor
2025
Characteristics evaluation of reverse blocking diode thyristor for DC circuit breaker
Solid-State Electronics·2025· 2 cited
The effect of series stacking on fast interruption for drift step recovery diode
Semiconductor Science and Technology·2024· 1 cited
Characteristics Evaluation of SiC MOSFET in DC Circuit Breaker
2024· 2 cited
Investigation of Reverse Blocking Diode Thyristor Under Microsecond Current Pulse
IEEE Journal of Emerging and Selected Topics in Power Electronics·2024· 4 cited
Transient turn-on characteristics of Si RBDT and SiC MOSFET under nanosecond current pulse range
Solid-State Electronics·2024· 4 cited
A Novel Trigger Method for Reversely Switched Dynistor to Eliminate Residual Voltage in Submicrosecond Pulse Range
IEEE Transactions on Power Electronics·2024· 3 cited
Impact of temperature on dynamic characteristics of 4H-silicon carbide drift step recovery diodes
Microelectronics Reliability·2023· 2 cited
A Pulsewidth Adjustable Trigger Method for Reverse Blocking Diode Thyristor to Suppress Current Filamentation and Improve <i>di/dt</i> Capability
IEEE Transactions on Power Electronics·2023· 4 cited
Suppression of Muzzle Arc in Electromagnetic Gun Based on Reversely Switched Dynistor
Lecture notes in electrical engineering·2023
Reverse Blocking Diode Thyristor With High Di/Dt Capability for Explosive Foil Initiator Applications
IEEE Transactions on Electron Devices·2022· 8 cited
Low-Voltage Turn-On Characteristics of RSD for Muzzle Arc Extinguishing of Electromagnetic Guns
IEEE Transactions on Plasma Science·2022· 3 cited
Failure case studies of fast ionization dynistors
Microelectronics Reliability·2021· 3 cited

Frequent Co-authors

Lin Liang(13), Xinyuan Huang(4), Xiaoxue Yan(4), Tong Liu(3), Zewei Yang(3), Mosai Xu(2), Ziyang Zhang(2), Lubin Han(2), Ziqing Guo(2), Ganping Wang(1), Hai Shang(1), Xiangyu Wan(1), Hui Yan(1), Zhiwen Li(1), Kaijun Wen(1)