R.H. Dyck

Sensors (United States) — United States

Engineering · Physical Sciences

7h-index477citations32works0.02yr avg
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Research Topics

CCD and CMOS Imaging Sensors(17), Infrared Target Detection Methodologies(10), Advanced Optical Sensing Technologies(7), Silicon and Solar Cell Technologies(3), Image Processing Techniques and Applications(3)

Publications32 total

Recent developments in image acquisition for manufacturing applications
Proceedings of WESCON '93·2002
Tributes To The Late Dr. Walter F. Kosonocky
IEEE Transactions on Electron Devices·1997
Sandbox CCDs
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1995· 8 cited
A 244X190 Element PtSi Imager Built With Mature CCD Production Technology
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1988· 2 cited
A 128X1024-Element TDI Image Sensor With Small, High Performance Pixels
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1988· 2 cited
Extension Of The "Modulation Transfer Function" Concept To Solid State Imagers Optically Coupled To Fiber-Optic Faceplates
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1987· 1 cited
Session 6 Detectors, sensors, and displays — Image sensor technology
1987
Session 14 Detectors, sensors and displays — Image sensors
1986
VLSI Imagers
Elsevier eBooks·1985
A 1024-Pixel CCD Line-Scan Image Sensor With Color Sensitivity
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1984
Design, Fabrication, and Performance of CCD Imagers
Elsevier eBooks·1982· 4 cited
<title>Large Time-Delay-And-Integration (TDI) Arrays And Focal Plane Structures With Intrinsic Silicon Response</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1981
A Large Area TDI Image Sensor for Low Light Level Imaging
IEEE Journal of Solid-State Circuits·1980· 25 cited
A large area TDI image sensor for low light level imaging
IEEE Transactions on Electron Devices·1980· 18 cited
A 128×1030 element CCD image sensor for a periscope camera system
1980
Charge-coupled device pseudo-noise matched filter design
Proceedings of the IEEE·1979· 19 cited
<title>A High Quantum Efficiency, Front-Side Illuminated CCD Area Image Sensor</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1977· 7 cited
Submicron patterning of surfaces
IEEE Journal of Solid-State Circuits·1977· 7 cited
Charge-transfer efficiency in a buried-channel charge-coupled device at very low signal levels
IEEE Transactions on Electron Devices·1976· 7 cited
Charge transfer efficiency in a buried-channel charge-coupled device at very low signal levels
IEEE Journal of Solid-State Circuits·1976· 2 cited
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Frequent Co-authors

Michael G. Farrier(3), K K. Shah(3), G. F. Amelio(3), Donald S. McClure(2), Gene P. Weckler(2), M. Jack(2), H. H. Hosack(2), Youssef S. Abedini(2), H. Elabd(2), E.G. Magill(1), Donald Grieco(1), P.C.Y. Chen(1), C. Kim(1), James R. Janesick(1), Tom Elliott(1), Rusty Winzenread(1), Jeff Pinter(1), Ralph Wight(1), J S. Kim(1), W Petro(1)