Carl Zeiss (Germany) — Germany
Materials Science · Physical Sciences
10h-index687citations20works0.02yr avg
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Research Topics
Electron and X-Ray Spectroscopy Techniques(16), Advanced Electron Microscopy Techniques and Applications(7), Advancements in Photolithography Techniques(7), Advanced X-ray Imaging Techniques(3), X-ray Spectroscopy and Fluorescence Analysis(2)
Publications20 total
Microscopy and Microanalysis·2018· 9 citedOpen Access
Microscopy and Microanalysis·2018Open Access
Ultramicroscopy·2010· 88 cited
AIP conference proceedings·2009Open Access
Microscopy and Microanalysis·2004· 25 cited
Microscopy and Microanalysis·2004· 3 cited
Advances in imaging and electron physics·2003· 33 cited
Surface Review and Letters·2002· 96 cited
Performance of the mirror corrector for an ultrahigh resolution spectromicroscope
2000· 6 cited
Design and manufactoring of magnetic electron optical systems with midsection symmetry
2000
Journal of Electron Microscopy·1999· 23 cited
Surface Review and Letters·1998· 86 cited
Journal of Electron Spectroscopy and Related Phenomena·1997· 154 cited
Journal of Electron Microscopy·1997· 75 cited
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment·1995· 30 cited
Procedures for minimizing the aberrations of electromagnetic compound lenses
TUbilio (Technical University of Darmstadt)·1995· 9 cited
Korrektur des Farb- und Öffnungsfehlers eines Niederspannungs-Elektronenmikroskops mit Hilfe eines Elektronenspiegels
1995· 5 cited
Outline of a versatile corrected LEEM
Optik·1992· 45 cited
Frequent Co-authors
H. Rose(12), Peter Hartel(9), R. Spehr(8), G. Benner(6), R. Fink(5), E. Umbach(5), W. Engel(5), G. Lilienkamp(5), Thomas Schmidt(5), H. Kuhlenbeck(4), Robert Schlögl(4), R. Wichtendahl(3), Hans‐Joachim Freund(3), A.M. Bradshaw(3), E. Bauer(3), Heiko Müller(3), Rasmus R. Schröder(3), M. Weiss(2), Ralf Degenhardt(2), Wolfgang Erlebach(2)