Sungho Kang

SK Group (South Korea) — South Korea

Computer Science · Physical Sciences

22h-index2.4kcitations433works2.72yr avg
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Research Topics

VLSI and Analog Circuit Testing(231), Integrated Circuits and Semiconductor Failure Analysis(169), Interconnection Networks and Systems(56), 3D IC and TSV technologies(43), Semiconductor materials and devices(38)

Publications433 total

Deciphering Failure Mechanisms of High-Ni Cathodes Via Residual Monomer-Driven Interphase Evolution in Gel Polymer Electrolytes
ECS Meeting Abstracts·2025
STAR-PIM: Self-Test and Repair Structure for Processing-in-Memory With Adder Tree-Based MAC
IEEE Transactions on Circuits and Systems I Regular Papers·2025· 1 cited
TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing
IEEE Transactions on Circuits and Systems I Regular Papers·2025
VASE: Vector Memory Using Bit-Level Address Segmentation for High-Speed Memory Testing
IEEE Transactions on Circuits and Systems I Regular Papers·2025
CLAPS: A Graph Clustering-Based Approach for Partial Scan Design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2025· 1 cited
Multistage Enhanced Diagnosis With Fault Candidate Reduction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2025
An Efficient Test Scheduling Method Based on Dynamic Pairing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2025
Residual Monomer‐Induced Side Reactions in Gel Polymer Electrolytes: Unveiled High‐Ni Cathode Failure in Lithium Batteries
Angewandte Chemie·2025Open Access
Residual Monomer‐Induced Side Reactions in Gel Polymer Electrolytes: Unveiled High‐Ni Cathode Failure in Lithium Batteries
Angewandte Chemie International Edition·2025· 4 cited
The effect of different metal pad sizes on shear stress in solder ball bonding
Journal of Materials Science Materials in Electronics·2025Open Access
A Novel CNN-Based Redundancy Analysis Using Parallel Solution Decision
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2025
Temperature-dependent electrochromic cycling performance of solution-processed WO<sub>3</sub> films
Nanoscale·2025
Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults
IEEE Access·2025Open Access
A New Test Point Insertion Using Weight Adjusted Grouping
IEEE Access·2025· 1 citedOpen Access
A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency
IEEE Access·2025Open Access
An Analysis on Determinants of Labor Market Participation of Elderly Workers for a Living
Journal of Korean Economics Studies·2024
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution
IEEE Access·2024Open Access
Comparative techno-economic evaluation of alkaline and proton exchange membrane electrolysis for hydrogen production amidst renewable energy source volatility
Energy Conversion and Management·2024· 35 cited
Projected changes in seasonal potential distribution of chub mackerel Scomber japonicus under continued ocean warming in Korean waters
Marine Ecology Progress Series·2024· 2 citedOpen Access
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2024· 2 cited
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Frequent Co-authors

Wooheon Kang(8), Keewon Cho(5), Hayoung Lee(5), Joo-Hwan Lee(4), Hyunjin Kim(4), Sunwoo Kim(3), Jay H. Lee(3), Woosik Jeong(3), Hong‐Sik Kim(3), HyungJun Cho(3), Jin-Ho Ahn(3), Hyejeong Hong(3), Minho Cheong(3), Hyunyul Lim(3), Joungho Park(2), Hyun‐Seok Cho(2), Hana Kim(2), F. Brasch(2), J. Van Ness(2), Joo-Young Kim(2)