Emmanuel Yashchin

IBM (United States) — United States

Decision Sciences · Social Sciences

19h-index1.3kcitations94works0.02yr avg
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Research Topics

Advanced Statistical Process Monitoring(40), Advanced Statistical Methods and Models(20), Scientific Measurement and Uncertainty Evaluation(18), Fault Detection and Control Systems(17), Statistical Distribution Estimation and Applications(12)

Publications94 total

Introduction to Wafer Tomography: Likelihood-Based Prediction of Integrated-Circuit Yield
2022· 1 cited
Statistical Aspects of Target Setting for Attribute Data Monitoring
2021
Foreword: Special issue on statistics in quality and productivity
Applied Stochastic Models in Business and Industry·2020Open Access
Foreword: Special issue on statistics in quality, industry, and technology
Applied Stochastic Models in Business and Industry·2020
Gradient analysis of Markov-type control schemes and its applications
Communications in Statistics - Simulation and Computation·2019· 1 cited
Discussion: A review of some sampling and aggregation strategies for basic statistical process monitoring (I. M. Zwetsloot and W. H. Woodall)
Journal of Quality Technology·2019· 1 cited
Issue Information
Applied Stochastic Models in Business and Industry·2019Open Access
Foreword: Special issue on statistics in business and industry
Applied Stochastic Models in Business and Industry·2018· 1 citedOpen Access
Foreword: Special issue on statistics in quality and productivity
Applied Stochastic Models in Business and Industry·2018Open Access
Issue Information
Applied Stochastic Models in Business and Industry·2018Open Access
Editor's notes on special issue on “reliability and maintenance modeling with big data”
Journal of Quality Technology·2018· 3 citedOpen Access
Statistical Monitoring of Multi-Stage Processes
2018· 8 cited
Discussion of “Scaling-up process characterization”
Quality Engineering·2017· 2 cited
Special Issue on Statistics in Quality Control
Applied Stochastic Models in Business and Industry·2016
Analyzing path delays for accelerated testing of logic chips
2015· 1 cited
Regenerative Likelihood Ratio Control Schemes
2015· 3 cited
Discussion of “Recent Advances in Process Monitoring: Nonparametric and Variable-Selection Methods for Phase I and Phase II”
Quality Engineering·2014
Foreword: Special Issue on Statistics in Quality and Productivity
Applied Stochastic Models in Business and Industry·2014
Masked Failure Data
Wiley StatsRef: Statistics Reference Online·2014· 1 cited
Selected Topics in Ultra-Low Emissivity Alpha-Particle Detection
IEEE Transactions on Nuclear Science·2013· 4 cited
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Frequent Co-authors

V. Beilin(6), Betty J. Flehinger(4), Benjamin Reiser(4), M. Roth(4), N. Angert(3), M. Tseitlin(3), C. Christiansen(3), J. Gill(3), Timothy Sullivan(3), R. G. Filippi(3), Thomas K. Philips(3), David M. Stein(3), I. Felner(3), M. Roth(3), Michal Roth(2), L. Ia. Kaplun(2), Baozhen Li(2), E. Dul’kin(2), Eduard Galstyan(2), M. I. Tsindlekht(2)