J. J. DeCorpo

United States Naval Research Laboratory — United States

Chemistry · Physical Sciences

17h-index1.1kcitations55works0.02yr avg
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Research Topics

Mass Spectrometry Techniques and Applications(17), Advanced Chemical Physics Studies(10), Ion-surface interactions and analysis(7), Analytical chemistry methods development(6), Inorganic and Organometallic Chemistry(6)

Publications55 total

On the development and use of fast atom beams for the SIMS analysis of polymers and insulators
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1984· 3 cited
ChemInform Abstract: SECONDARY ION MASS SPECTROMETRY OF METAL HALIDES. 2. EVIDENCE FOR STRUCTURE IN ALKALI IODIDE CLUSTERS
Chemischer Informationsdienst·1982· 12 cited
Summary Abstract: High‐performance molecular secondary ion mass spectrometry (SIMS)
Journal of Vacuum Science and Technology·1982· 2 cited
ChemInform Abstract: SECONDARY ION MASS SPECTROMETRY OF METAL HALIDES. 1. STABILITY OF ALKALI IODIDE CLUSTERS
Chemischer Informationsdienst·1982
Summary Abstract: On the formation and emission of polyatomic secondary ions from metal salts
Journal of Vacuum Science and Technology·1982· 7 cited
Secondary ion mass spectrometry of metal halides. 2. Evidence for structure in alkali iodide clusters
Journal of the American Chemical Society·1982· 127 cited
Mass Spectrometry of Low-Dimensional Materials
1982· 4 cited
Secondary ion mass spectrometry of metal halides. 1. Stability of alkali iodide clusters
The Journal of Physical Chemistry·1981· 80 cited
Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic Crystals
Physical Review Letters·1981· 191 cited
Nitrogen Trifluoride Combustion and Suppression
1981· 1 cited
Application of dynamic emittance matching to secondary ion mass spectrometry
Review of Scientific Instruments·1981· 14 cited
Mass-spectral investigation of AsF5-doped (CH)x
International Journal of Mass Spectrometry and Ion Physics·1981· 7 cited
ChemInform Abstract: SELECTIVE MULTIPHOTON IONIZATION OF GEOMETRIC ISOMERS. CIS‐ AND TRANS‐1,2‐DICHLOROETHENE
Chemischer Informationsdienst·1981
Characterization of polymeric thin films by low-damage secondary ion mass spectrometry
Applications of Surface Science·1981· 31 cited
Selective multiphoton ionization of geometric isomers. cis- and trans-1,2-Dichloroethene
The Journal of Physical Chemistry·1981· 11 cited
High-performance secondary ion mass spectrometer
Review of Scientific Instruments·1980· 47 cited
Mass spectrometric characterization of halogen doped polyacetylene
Synthetic Metals·1980· 16 cited
Use of a Photoionization Detector as a Hydrocarbon Trace Gas Analyzer.
Defense Technical Information Center (DTIC)·1980· 1 cited
ArF excimer laser multiphoton-ionization mass spectrometry of organic molecules
International Journal of Mass Spectrometry and Ion Physics·1980· 50 cited
CENTRAL A TMOSPHERE MONITOR (CAMS)
Naval Engineers Journal·1980· 2 cited
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Frequent Co-authors

Jeffrey R. Wyatt(26), F. E. Saalfeld(18), Joseph E. Campana(10), Richard J. Colton(10), Richard Smith(8), M. V. McDowell(8), T. M. Barlak(7), W. N. Allen(5), J. L. Franklin(4), Jeffrey W. Hudgens(4), David C. Weber(4), Mark Seaver(3), F. W. Lampe(3), James R. Holtzclaw(3), D. A. Bafus(2), Patrick Brant(2), Michael J. Moran(2), A. G. MacDiarmid(2), Raymond A. Saunders(2), R. C. Clark(2)