Kuifeng Zhu

Tianjin University of Technology — China

Engineering · Physical Sciences

5h-index175citations11works0.72yr avg
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Research Topics

Industrial Vision Systems and Defect Detection(4), Transition Metal Oxide Nanomaterials(3), Ga2O3 and related materials(3), ZnO doping and properties(2), Perovskite Materials and Applications(2)

Publications11 total

Collaborative engineering of Co2P and Co-N-C dual active sites to boost bifunctional activity for air electrodes in rechargeable Zn-air batteries
Journal of Alloys and Compounds·2025
Ethanol-modulated growth of TiO2 nanorod arrays for self-powered ultraviolet photodetectors and optical logic gates
Physica B Condensed Matter·2025
Optimized electrodeposition of CuSCN on ZnO nanorods arrays for high-performance self-powered ultraviolet photodetectors
Journal of Luminescence·2025· 2 cited
Cs<sub>3</sub>Bi<sub>2</sub>Br<sub>9</sub> Halide Perovskite Nanostructure/Polymer Composite Films Resistive Memory
The Journal of Physical Chemistry C·2023· 7 cited
Self-powered ultraviolet photodetectors based on match like quasi one-dimensional n-TiO2/p-NiO core-shell heterojunction arrays with NiO layer sputtered at different power
Journal of Alloys and Compounds·2022· 23 cited
Self-Powered Uv Photodetectors Based on N-Tio2/P-Nio Core-Shell Heterojunction Arrays with Optimized Performance: From the Viewpoint of Photogenerated Carriers Interface Separation and Transmission
SSRN Electronic Journal·2022Open Access
The fabrication of a self-powered CuInS<sub>2</sub>/TiO<sub>2</sub> heterojunction photodetector and its application in visible light communication with ultraviolet light encryption
Journal of Materials Chemistry C·2021· 51 cited
K-means clustering with morphological filtering for silicon wafer grain defect detection
2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)·2020· 11 cited
Wafer defect detection method based on machine vision
Proceedings of International Conference on Artificial Life and Robotics·2020
A Light-Weighted CNN Model for Wafer Structural Defect Detection
IEEE Access·2020· 78 citedOpen Access
A compact Robot-based defect detection device design for silicon wafer
Journal of Physics Conference Series·2020· 3 citedOpen Access

Frequent Co-authors

Yanjie Su(7), Jianping Xu(6), Lan Li(6), Jianyong Chen(4), Chundong Zhao(4), Dongyang Zhang(4), Shaobo Shi(4), Yanjie Su(3), Xiaoyan Chen(2), Jing Chen(2), Jianghua Xu(2), Xiaosong Zhang(2), Rui Cao(2), Shaobo Shi(2), Xiaohong Chen(2), Lu Jiao(2), Xiaoguang Han(1), Menghan Li(1), Qiuyang Zhang(1), Yichen Bu(1)