J. Lowell

Physics and Astronomy · Physical Sciences

27h-index3.8kcitations132works0.02yr avg
OpenAlex↗Google Scholar↗

Accepting Students?

No reports yet. Know if this professor is taking students?

Research Topics

Physics of Superconductivity and Magnetism(27), Integrated Circuits and Semiconductor Failure Analysis(21), Semiconductor materials and devices(18), Silicon and Solar Cell Technologies(18), Conducting polymers and applications(16)

Publications132 total

Retrieving Leaf Area Index and Foliage Profiles Through Voxelized 3-D Forest Reconstruction Using Terrestrial Full-Waveform and Dual-Wavelength Echidna Lidars
AGU Fall Meeting Abstracts·2013
Separating Leaves from Trunks and Branches with Dual-Wavelength Terrestrial Lidar Scanning: Improving Canopy Structure Characterization in 3-D Space
AGU Fall Meeting Abstracts·2013· 2 cited
Integrated Circuit Technology
2009
Advances in Slow and Fast Light I: Proceedings SPIE Photonics West
2008
The news from Switzerland is very bad
2007
Nonlinear spectroscopy and process monitoring of Si
2005
Comparative Optical Techniques for Monitoring Metals in Single-Crystal Silicon
2005· 1 cited
The Science Detectives
2005
In-line, real-time nondestructive monitoring of Fe contamination for statistical process control (SPC) by surface photovoltage (SPV)
2002· 2 cited
Application of optical second harmonic generation in characterization of Si(100)/SiO/sub 2/ interfacial microroughness
2002
Oxide charging induced by electron exposure in ion implantation: quantification and qualification
2002
Characterization of surface barrier effects from Cu-implanted SiO/sub 2//Si interfaces
2002
Nondestructive determination of boron doses in semiconductor materials using neutron depth profiling
2002· 2 cited
Removal of hydrogen from 2H::Si(100) by sputtering and recoil implantation
2002
A new, in-line method for separating frontside/backside metalilic contamination from implantation
2002
Ion implant damage detection by surface photovoltage
2002
Passive evaluation of surface and bulk ionic deposition from resist removal using surface photovoltage
2002
Non-destructive detection of ion implant contamination: a SEMATECH/AMD study
2002
<title>Correlating EEPROM end-of-line measurements with PDM in-line charging monitoring for ion implantation</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1998
Gettering of Iron and Surface Oxygen by High-Energy Boron ion Implantation in Silicon
MRS Proceedings·1998· 1 cited
page 1 of 7Next →

Frequent Co-authors

Arthur Rose-Innes(4), J. B. Sousa(4), Jerry I. Dadap(4), M. C. Downer(4), X. Hu(3), A.R. Akande(3), Mark P. Wilson(3), W.S. Truscott(2), Mark Anderson(2), O.A. Aktsipetrov(2), W.J. Brennan(2), J.S. Muñoz(2), Rhiannon French(2), K. Mendelssohn(2), A F Labadz(2), R. A. Heelis(1), R. W. Spiro(1), B. Doris(1), Qiwen Deng(1), Alain C. Diebold(1)