P. Mengel

Siemens (Germany) — Germany

Physics and Astronomy · Physical Sciences

10h-index393citations28works0.02yr avg
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Research Topics

Advanced Optical Sensing Technologies(8), CCD and CMOS Imaging Sensors(6), Ocular and Laser Science Research(5), Semiconductor Quantum Structures and Devices(4), Quantum Dots Synthesis And Properties(4)

Publications28 total

Advanced time-of-flight range camera with novel real-time 3D image processing
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2007· 1 cited
A 64×8 Pixel 3-D CMOS Time Of Flight Image Sensor for Car Safety Applications
2006· 34 cited
Three-Dimensional CMOS Image Sensor for Pedestrian Protection and Collision Mitigation
VDI-Buch·2006· 15 cited
X-ray and ultraviolet photoemission of polymeric sulfur nitride (SN)x
Lecture notes in physics·2005
A 4/spl times/64 pixel CMOS image sensor for 3-D measurement applications
IEEE Journal of Solid-State Circuits·2004· 63 cited
Modeling of a 3D CMOS sensor for time-of-flight measurements
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2004
Three-dimensional CMOS image sensor with 4x64 pixel array
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2004· 1 cited
A 4/spl times/64 pixel CMOS image sensor for 3D measurement applications
2003· 15 cited
Automated solder joint inspection system using optical 3-D image detection
2002· 8 cited
Automated inspection of solder joints on PC boards by supplementary processing of 3D and gray-level images
2002· 8 cited
Fast range imaging by CMOS sensor array through multiple double short time integration (MDSI)
2002· 26 cited
A CMOS photosensor array for 3D imaging using pulsed laser
2001· 63 cited
3D Perception for Vehicle Inner Space Monitoring
2000· 3 cited
Kameraanwendung im Fahrzeuginnenraum
Elektronik im Kraftfahrzeug. Tagung·2000· 2 cited
Application of Advanced Data Processing Technology for Integrated Inspection in Electrotechnical Assembly
CIRP Annals·1992· 10 cited
SENSOR INTEGRATION — GETTING THE WHOLE PICTURE
Sensor Review·1992· 5 cited
Automatic classification of solder joint images
1991· 3 cited
3D object recognition system using laser range finder
1991· 2 cited
Automatic mask alignment for X-ray microlithography
Microelectronic Engineering·1986· 10 cited
Investigations on resists, polyimide masks and alignment for X-ray lithography
OpenGrey (Institut de l'Information Scientifique et Technique)·1982
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Frequent Co-authors

B.J. Hosticka(8), L. Listl(8), W. Brockherde(6), O. Elkhalili(5), Olaf Schrey(5), H. Liebing(4), Martin Petermann(3), G. Doemens(3), R. Jeremias(2), P. M. Grant(2), W. E. Rudge(2), Wiebke Ulfig(2), Wolfgang Ruppel(2), Josef F. Bille(2), S. Boverie(2), D Zittlau(2), B. H. Schechtman(1), Dale W. Rice(1), Bernhard König(1), Christian Toepfer(1)