Rainer Tutsch

Technische Universität Braunschweig — Germany

Engineering · Physical Sciences

13h-index762citations154works1.62yr avg
OpenAlex↗ORCID↗Google Scholar↗Lab page↗

Accepting Students?

No reports yet. Know if this professor is taking students?

Research Topics

Advanced Measurement and Metrology Techniques(68), Optical measurement and interference techniques(51), Surface Roughness and Optical Measurements(33), Advanced Surface Polishing Techniques(22), Force Microscopy Techniques and Applications(18)

Publications154 total

Accurate AFM Calibration of Indenter Geometry for Instrumented Indentation
Nanomanufacturing and Metrology·2025· 2 citedOpen Access
Phase shifting Interferometry and Wavefront Compensation using Liquid Crystal on Silicon (LCOS) Spatial Light Modulator (SLM)
ArXiv.org·2025Open Access
Themenheft Sensoren und Messsysteme 2024
tm - Technisches Messen·2025Open Access
Influence of scanning strategies on dimensional accuracy in laser powder bed fusion
Measurement Sensors·2025· 2 citedOpen Access
A practically oriented, efficient alternative to the Monte Carlo method for measurement uncertainty estimation
Metrologia·2025· 1 citedOpen Access
Hybrid method combining SEM and AFM in reference metrology for characterization of the instrument transfer function using CCS material measure
Measurement Sensors·2025· 1 citedOpen Access
Reducing temperature instabilities with additively manufactured parts
Measurement Sensors·2025Open Access
Hybrid AI-PID control for precision metrology
Measurement Sensors·2024Open Access
Correcting Rockwell hardness values based on improved measurements of diamond indenters using a confocal laser scanning microscope
Measurement Sensors·2024Open Access
Novel hybrid interference and atomic force microscopy
Measurement Science and Technology·2024· 2 citedOpen Access
Calibration of the spherical tip radius of Rockwell hardness diamond indenters using a confocal laser scanning microscope
Measurement Science and Technology·2024· 1 citedOpen Access
A New Kind of Atomic Force Microscopy Scan Control Enabled by Artificial Intelligence: Concept for Achieving Tip and Sample Safety Through Asymmetric Control
Nanomanufacturing and Metrology·2024· 10 citedOpen Access
Evaluation of different sampling strategies for pointwise measurement of aspheric surfaces
2023
Systematische Simulationsmethode zur effizienten Abschätzung von Unsicherheiten komplexer Messungen – ein Zwischenweg von klassischem GUM und der Monte-Carlo Methode
tm - Technisches Messen·2023Open Access
Inhaltsverzeichnis
tm - Technisches Messen·2023Open Access
Physically based rendering method to derive realistic simulation of chromatic confocal measurements
2023
On the importance of multi-material acceptance testing for CT-based CMSs
Precision Engineering·2023· 2 cited
A feasibility study towards traceable calibration of size and form of microspheres by stitching AFM images using ICP point-to-plane algorithm
Measurement Science and Technology·2023· 7 citedOpen Access
D6.3 - Recent progress on AFM te chniques for traceable 3D nanometrology at PTB
Lectures·2023Open Access
A multi-wavelength approach to structured illumination
2022
page 1 of 8Next →

Frequent Co-authors

Marcus Petz(12), Gaoliang Dai(9), Leobaldo Casarotto(4), Johannes Degenhardt(4), Marc Fischer(4), Hanno Dierke(3), H. Neuhäuser(3), Harald Bosse(3), Michael Schulz(3), Kerstin Schöttler(3), Christoph Weichert(2), Reinhold Ritter(2), F.B. Klose(2), Hagen Broistedt(2), Manuel Stavridis(2), Maryna Galovska(2), S. Büttgenbach(2), M. Berndt(2), Jan Thiesler(2), Ulrich Neuschaefer-Rube(2)