Martin Fuechsle

Physics and Astronomy · Physical Sciences

8h-index1.4kcitations15works0.02yr avg
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Research Topics

Quantum and electron transport phenomena(12), Advancements in Semiconductor Devices and Circuit Design(6), Molecular Junctions and Nanostructures(4), Surface and Thin Film Phenomena(4), Semiconductor Quantum Structures and Devices(3)

Publications15 total

Origin of metallic-like behavior in disordered carbon nano-onions
Carbon·2023· 17 citedOpen Access
Correction to Probing the Quantum States of a Single Atom Transistor at Microwave Frequencies
ACS Nano·2017· 2 citedOpen Access
Probing the Quantum States of a Single Atom Transistor at Microwave Frequencies
ACS Nano·2016· 22 citedOpen Access
Quantum dot spectroscopy using a single phosphorus donor
Physical Review B·2015· 10 citedOpen Access
Charge sensing of a few-donor double quantum dot in silicon
Applied Physics Letters·2015· 7 citedOpen Access
A surface code quantum computer in silicon
Science Advances·2015· 241 citedOpen Access
A Tight-Binding Study of Single-Atom Transistors
Small·2014· 19 citedOpen Access
Using Scanning Tunneling Microscopy to Realize Atomic- Scale Silicon Devices
Pan Stanford Publishing eBooks·2013· 1 cited
Electronic spectrum of a deterministic single-donor device in silicon
AIP conference proceedings·2013
Realisation of a single-atom transistor in silicon
Journal and proceedings of the Royal Society of New South Wales·2012· 2 citedOpen Access
Spectroscopy of a deterministic single-donor device in silicon
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2012· 3 cited
A single-atom transistor
Nature Nanotechnology·2012· 844 cited
Spectroscopy of few-electron single-crystal silicon quantum dots
Nature Nanotechnology·2010· 182 cited
Spectroscopy of a few-electron single-crystal silicon quantum dot
Bulletin of the American Physical Society·2010
Surface gate and contact alignment for buried, atomically precise scanning tunneling microscopy–patterned devices
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2007· 21 cited

Frequent Co-authors

M. Y. Simmons(14), Suddhasatta Mahapatra(6), Lloyd C. L. Hollenberg(6), Jill A. Miwa(5), Matthew House(4), Hoon Ryu(3), Oliver Warschkow(3), Gerhard Klimeck(3), Samuel J. Hile(3), Sven Rogge(3), Sunhee Lee(2), Floris A. Zwanenburg(2), Mark Friesen(2), G. C. Tettamanzi(2), Holger Büch(2), Charles D. Hill(1), Eldad Peretz(1), M. A. Eriksson(1), F. J. Rueß(1), T. C. G. Reusch(1)