Biswajit Ray

Banaras Hindu University — India

Engineering · Physical Sciences

25h-index2.0kcitations172works0.52yr avg
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Research Topics

Semiconductor materials and devices(37), Advanced DC-DC Converters(35), Advanced Memory and Neural Computing(27), Advanced Data Storage Technologies(27), Organic Electronics and Photovoltaics(22)

Publications172 total

Boiling, Degassing, and Mixing of Fluids in the Trans-Himalayan Geothermal Systems, India
Earth Systems Resources and Sustainability·2026Open Access
Special Issue on Emerging Challenges With 3-D NAND Flash Storage
IEEE Design and Test·2026
Radiation Induced Leakage Current in 3-D NAND Technology
IEEE Transactions on Nuclear Science·2026
TCFlash: In-Flash Bulk Bitwise Processing via Dynamic Sensing and TLC Encoding in 3D NAND
2025
RADPIC: A Radiation-Aware Design-Space Exploration and Simulation Framework for SOI-Based Photonic Integrated Circuits
2025
Magnetic Field-Driven Physically Unclonable Function in 40nm p-MTJ STT-MRAM
2025
Analysis of Temperature Effect on SRAM PUF for Low Cost Applications
2025
Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs
IEEE Design and Test·2025
Page-Overwrite Data Sanitization in 3D NAND Flash: Challenges, Feasibility, and the PULSE Solution
ACM Transactions on Embedded Computing Systems·2025Open Access
Integrating Full-Featured and Freely-Downloadable Circuit Simulation Software into Multiple EET Courses
2025
Magnetic Field-Induced STT-MRAM Read Noise for High-Entropy True RNG
2025
Enhancing 3D NAND flash endurance via thermal annealing: A step towards everlasting SSDs
2025
State Dependent Threshold Voltage Shift in Irradiated 64-Layer 3-D NAND Memories
IEEE Transactions on Nuclear Science·2025
Ionizing Radiation-Induced Data Imprinting Effects in SRAM Arrays
IEEE Transactions on Nuclear Science·2025· 1 cited
A Comparative Analysis of Radiation Tolerance in Charge-Trap and Floating-Gate 3-D NAND Memory Technologies
IEEE Transactions on Nuclear Science·2025· 1 cited
Assessing Magnetic Attack on Commercial 40nm pMTJ STT-MRAM
2024· 2 cited
Data Remanence Vulnerabilities in Commercial SRAM at Low Temperature
2024· 1 cited
Fortifying the NAND Flash Supply Chain with Innovative Security Primitives
2024Open Access
Real-Time Radiation Dosimeter Using SRAM Power-Up State
2024
Exploring Cross-Temperature Reliability in 3D NAND Through Layer-Dependent Bit Error Analysis
2024
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Frequent Co-authors

Muhammad A. Alam(9), Richard L. Patterson(8), Scott S. Gerber(7), Preeti Kumari(7), James D. Scofield(6), M. Wasiolek(6), H. Kosai(5), Khalid Hattar(5), Seana McNeal(4), Aleksandar Milenković(4), I. T. Myers(4), Md Tauhidur Rahman(4), Umeshwarnath Surendranathan(4), B. Jordan(3), Brett Jordan(3), B. M. S. Bahar Talukder(3), Sadman Sakib(3), Aditya G. Baradwaj(2), Bryan W. Boudouris(2), Md Ashraful Alam(2)