S. P. Tear

University of York — United Kingdom

Physics and Astronomy · Physical Sciences

21h-index2.4kcitations103works1.52yr avg
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Research Topics

Surface and Thin Film Phenomena(46), Electron and X-Ray Spectroscopy Techniques(36), Semiconductor materials and interfaces(23), Advanced Chemical Physics Studies(18), Advanced Materials Characterization Techniques(12)

Publications103 total

Secondary Electron Hyperspectral Imaging of Carbons: New Insights and Good Practice Guide
Advanced Science·2025· 3 citedOpen Access
Observation of spinterface formation on α−sexithiophene (6T)/magnetite Fe3O4 thin films
SSRN Electronic Journal·2025Open Access
Spinterface Formation of Sexithiophene (6T) on Ferromagnetic Surfaces
IEEE Transactions on Magnetics·2023· 1 cited
Spinterface formation of sexithiophene (6T) on ferromagnetic surfaces
2023
In‐Operando Lithium‐Ion Transport Tracking in an All‐Solid‐State Battery
Small·2022· 14 citedOpen Access
The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy
Ultramicroscopy·2022· 2 citedOpen Access
Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy
Applied Physics Letters·2022· 2 citedOpen Access
Scanning Field Emission Microscopy with Spin and Energy Analysis
2021· 1 cited
Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
2021· 1 cited
Formation of quasi-free-standing graphene on SiC(0001) through intercalation of erbium
AIP Advances·2021· 11 citedOpen Access
The Mechanism of Vesicle Solubilization by the Detergent Sodium Dodecyl Sulfate
Langmuir·2020· 47 citedOpen Access
Improving the Detection and the Analysis of Energy Filtered and Spin Polarised Electrons with the implementation of a Miniature Energy Analyser
2020· 1 cited
The Mechanism of Vesicle Solubilization by the Detergent Sodium Dodecyl Sulfate
2020Open Access
Next generation secondary electron detector with energy analysis capability for SEM
Journal of Microscopy·2020· 8 citedOpen Access
Analysis and detection of low-energy electrons in scanning electron microscopes using a Bessel box electron energy analyser
Journal of Electron Spectroscopy and Related Phenomena·2019· 9 cited
Electron energy analysis at the nanometer scale using a near field emission scanning electron microscope (NFESEM)
2018
Characterization of a Miniature Electron Energy Analyzer for Scanning Electron Microscopes
Journal of Physics Conference Series·2017· 4 citedOpen Access
Atomic study of Hybrid Spintronic Heterostructures: Co<sub>2</sub>FeAl<sub>05</sub>Si<sub>0.5</sub>/Ge(111)
Microscopy and Microanalysis·2017Open Access
Simulation of a Bessel box electron energy analyser for analysis of secondary electrons
European Microscopy Congress 2016: Proceedings·2016· 2 citedOpen Access
Spatial resolution and compositional contrast in imaging using the low‐loss electron signal in <scp>SEM</scp>
European Microscopy Congress 2016: Proceedings·2016
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Frequent Co-authors

T.C.Q. Noakes(9), Paul Bailey(9), D. Spence(8), Andrew Pratt(7), M. Prutton(7), C. Bonet(7), Karen Tiede(6), Christopher Eames(5), Alistair B.A. Boxall(4), Helen David(4), M.R. Welton-Cook(4), Todd Wood(4), John Lewis(3), Charles Woffinden(3), Dirk Tiede(2), Leonardo Lari(2), Alistair B.A. Boxall(2), K. Hayek(2), H. Glassl(2), A. Gutmann(2)