Stephen Jesse

Oak Ridge National Laboratory — United States

Physics and Astronomy · Physical Sciences

76h-index20.2kcitations636works2.82yr avg
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Research Topics

Force Microscopy Techniques and Applications(188), Ferroelectric and Piezoelectric Materials(148), Electron and X-Ray Spectroscopy Techniques(101), Acoustic Wave Resonator Technologies(100), Advanced Electron Microscopy Techniques and Applications(96)

Publications636 total

Auto-3DPFM: Automating Polarization-Vector Mapping at the Nanoscale
arXiv (Cornell University)·2025Open Access
Nanosculpting lateral weak link junctions in superconducting Fe(Te,Se)/Bi2Te3 with focused Si++ ions and implications on vortex pinning
arXiv (Cornell University)·2025Open Access
Probing Spin Defects via Single Spin Relaxometry
2025Open Access
Autonomous Multistate Nanoencoding Using Combinatorial Ferroelectric Closure Domains in BiFeO<sub>3</sub>
ACS Nano·2025· 2 cited
Automated and Autonomous Scanning Transmission Electron Microscopy: Transformers and Generative Machine Learning for Image Optimization and Segmentation
Microscopy and Microanalysis·2025Open Access
Autonomous Fabrication of Tailored Defect Structures in 2D Materials using Machine Learning-enabled Scanning Transmission Electron Microscopy
arXiv (Cornell University)·2025Open Access
Tracking Charge Dynamics by High Speed and Time Resolved Kelvin Probe Force Microscopy
Microscopy and Microanalysis·2025
Evidence of chiral fermion edge modes through geometric engineering of thermal Hall in $α$-RuCl$_3$
arXiv (Cornell University)·2025Open Access
Probing Spin Defects via Single Spin Relaxometry
arXiv (Cornell University)·2025Open Access
Nanoscale Polarization-Dependent Young’s Modulus of Ferroelectric BaTiO<sub>3</sub> Single Crystals
ACS Nano·2025· 3 cited
A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy (Adv. Mater. Technol. 5/2025)
Advanced Materials Technologies·2025· 1 citedOpen Access
Telecom-Wavelength Single-Photon Emitters in Multilayer InSe
ACS Nano·2025· 6 cited
A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy
Advanced Materials Technologies·2025· 2 cited
Imaging Bias‐Driven Domain Wall Motion With Scanning Oscillator Piezoresponse Force Microscopy
Small Methods·2025· 1 cited
Your Clean Graphene is Still Not Clean (Adv. Mater. Interfaces 1/2025)
Advanced Materials Interfaces·2025Open Access
Your Clean Graphene is Still Not Clean
Advanced Materials Interfaces·2024· 2 citedOpen Access
Exploring electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy
npj Computational Materials·2024· 4 citedOpen Access
Telecom-wavelength Single-photon Emitters in Multi-layer InSe
arXiv (Cornell University)·2024Open Access
On-demand nanoengineering of in-plane ferroelectric topologies
Nature Nanotechnology·2024· 7 citedOpen Access
A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy
arXiv (Cornell University)·2024Open Access
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Frequent Co-authors

Sergei V. Kalinin(45), Nina Balke(17), Arthur P. Baddorf(11), Rama K. Vasudevan(11), Brian J. Rodriguez(8), Alex Belianinov(8), Anna N. Morozovska(7), Petro Maksymovych(7), Alexander Tselev(7), Eugene А. Eliseev(6), Bobby G. Sumpter(5), Olga S. Ovchinnikova(5), Roger Proksch(4), Raymond R. Unocic(4), Amit Kumar(4), Evgheni Strelcov(4), M. Baris Okatan(4), R. Ramesh(3), Maxim Ziatdinov(3), Ondrej Dyck(3)