L.A. Knauss

Booz Allen Hamilton (United States) — United States

Materials Science · Physical Sciences

17h-index1.5kcitations62works0.02yr avg
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Research Topics

Ferroelectric and Piezoelectric Materials(29), Electronic and Structural Properties of Oxides(15), Integrated Circuits and Semiconductor Failure Analysis(13), Acoustic Wave Resonator Technologies(10), Electron and X-Ray Spectroscopy Techniques(10)

Publications62 total

Introduction
Journal of Materials Science Materials in Electronics·2011Open Access
Construction of a 3-D Current Path Using Magnetic Current Imaging
Proceedings - International Symposium for Testing and Failure Analysis·2007· 10 cited
High-throughput screening of magnetic properties of quenched metallic-alloy thin-film composition spreads
Applied Surface Science·2007· 19 cited
Advances in Magnetic Current Imaging for Die-Level Fault Isolation
EDFA Technical Articles·2006· 1 cited
Tunable multiferroic properties in nanocomposite PbTiO3–CoFe2O4 epitaxial thin films
Applied Physics Letters·2005· 82 cited
Waveguide study of KTaNbO/sub 3/ epitaxial film on GaAs substrate
2005
Advances in magnetic-based current imaging for high resistance defects and sub-micron resolution
2004· 12 cited
Failure analysis on resistive opens with Scanning SQUID Microscopy
2004· 11 cited
Combinatorial Investigation of Ferromagnetic Shape-Memory Alloys in the Ni-Mn-Al Ternary System Using a Composition Spread Technique
Scholar Commons (University of South Carolina)·2004
Scanning SQUID Microscope
Elsevier eBooks·2004
Combinatorial Investigation of Ferromagnetic Shape-Memory Alloys in the Ni-Mn-Al Ternary System Using a Composition Spread Technique
MATERIALS TRANSACTIONS·2004· 26 citedOpen Access
Fault Isolation of High Resistance Defects Using Comparative Magnetic Field Imaging
Proceedings - International Symposium for Testing and Failure Analysis·2003· 8 cited
High Resolution Current Imaging by Direct Magnetic Field Sensing
Proceedings - International Symposium for Testing and Failure Analysis·2003· 5 cited
Advances in scanning SQUID microscopy for die-level and package-level fault isolation
Microelectronics Reliability·2003· 8 cited
4.2K Cryocooled Scanning SQUID Microscope
APS March Meeting Abstracts·2003
Identification of novel compositions of ferromagnetic shape-memory alloys using composition spreads
Nature Materials·2003· 254 cited
Polarization switching and long-time relaxation effects induced by off-center ions in KTa/sub 1-x/Nb/sub x/O/sub 3/
2003
Large area SrTiO/sub 3/ thin films for active microwave applications grown by pulsed laser deposition
2002
Short failure analysis under fault isolation
2002· 6 cited
Localizing power to ground shorts in a chips-first MCM by scanning SQUID microscopy
2002· 8 cited
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Frequent Co-authors

F. C. Wellstood(9), Douglas B. Chrisey(9), Antonio Orozco(8), E. F. Fleet(8), K. S. Harshavardhan(8), J.M. Pond(7), J. S. Horwitz(7), Hans M. Christen(7), J. Toulouse(6), S. Chatraphorn(6), Ichiro Takeuchi(5), Carl H. Mueller(5), R.C.Y. Auyeung(5), A. B. Cawthorne(4), K. S. Grabowski(4), Solomon I. Woods(4), Maria A. Aronova(3), Kao‐Shuo Chang(3), S. E. Lofland(3), Manfred Wuttig(3)