E. Seebacher

AMS (Austria) — Austria

Engineering · Physical Sciences

9h-index370citations56works0.02yr avg
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Research Topics

Advancements in Semiconductor Devices and Circuit Design(30), Silicon Carbide Semiconductor Technologies(21), Electrostatic Discharge in Electronics(18), Semiconductor materials and devices(14), Electromagnetic Compatibility and Noise Suppression(13)

Publications56 total

Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits
2017· 3 cited
Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET
Solid-State Electronics·2017· 3 cited
Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology
IEEE Transactions on Circuits and Systems I Regular Papers·2016· 2 citedOpen Access
Analysis of substrate currents propagation in HVCMOS technology
2016Open Access
Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET
Solid-State Electronics·2016· 1 cited
Towards Automatic Diagnosis of Minority Carriers Propagation Problems in HV/HT Automotive Smart Power ICs
HAL (Le Centre pour la Communication Scientifique Directe)·2016Open Access
Towards Automatic Diagnosis of Minority Carriers Propagation Problems in HV/HT Automotive Smart Power ICs
2016· 2 cited
Coupling study in smart power mixed ICs with a dedicated on-chip sensor
2015· 1 citedOpen Access
A CAD integrated solution of substrate modeling for industrial IC design
2015· 2 citedOpen Access
Smart power mixed ICs parasitic bipolar coupling issues analysis with a dedicated on-chip sensor
2015· 1 cited
Analysis of drain bias dependence of 1/f noise in HV-MOSFETs
2015· 1 cited
Modeling of geometrically scalable integrated finger diodes
2014· 1 cited
Methodology for 1/f noise parameter extraction for high-voltage MOSFETs
Solid-State Electronics·2014· 3 cited
Simple 1/f noise parameter extraction method for high-voltage MOSFETs
2014· 4 cited
Non-linear thermal simulations of semiconductor devices on system level
2013
AUTOMICS: A novel approach for substrate modeling for Automotive applications
HAL (Le Centre pour la Communication Scientifique Directe)·2013· 1 citedOpen Access
Special Issue on Advanced Modeling of Power Devices and Their Applications
IEEE Transactions on Electron Devices·2013
Measurement and Compact Modeling of 1/f Noise in HV-MOSFETs
IEEE Transactions on Electron Devices·2012· 9 citedOpen Access
Correlated statistical SPICE models for High-Voltage LDMOS Transistors based on TCAD statistics
TechConnect Briefs·2012
Integrated Capacitor Array Matching Characterization
IEEE Transactions on Semiconductor Manufacturing·2012· 2 cited
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Frequent Co-authors

Walter Pflanzl(13), Alexander Steinmair(11), Werner Posch(10), Z. Huszka(9), H. Enichlmair(7), Rainer Minixhofer(7), K. Molnár(6), Matthias Bucher(6), Thomas Gneiting(6), Stanislav Tyaginov(5), Ivan A. Starkov(5), Christoph Jungemann(5), S. Carniello(5), H. Ceric(5), Tibor Grasser(5), Jean-Michel Sallèse(5), Ramy Iskander(5), O. Triebl(4), J.M. Park(4), M. Karner(4)