Hyuk Joo Kwon

Engineering · Physical Sciences

6h-index123citations17works0.02yr avg
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Research Topics

Advancements in Photolithography Techniques(8), Electron and X-Ray Spectroscopy Techniques(8), Welding Techniques and Residual Stresses(4), Integrated Circuits and Semiconductor Failure Analysis(3), Organic Light-Emitting Diodes Research(2)

Publications17 total

Characterization of Electro-deposited Ni-P Layer by Using Dynamic Nano-Indentation Method
2018
초음파 습식 자기분류법을 이용한 MgxNiyZn1-x-yFe2O4 나노입자 제조
2017
코스닥 IPO 기업 장기성과에 대한 실증연구: 공모자금 사용목적과의 관련성을 중심으로 = An empirical analysis of long-run performance on KOSDAQ IPO stocks: a relation with intended use of capital
2015
Investigating printability of native defects on EUV mask blanks through simulations and experiments
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2014· 2 cited
Applications of advanced metrology techniques for the characterization of extreme ultraviolet mask blank defects
Journal of Micro/Nanolithography MEMS and MOEMS·2013· 3 cited
Learning Styles of Australian Aviation Students: An Assessment of the Impact of Culture
Collegiate Aviation Review International·2013· 8 citedOpen Access
Advanced metrology techniques for the characterization of EUV mask blank defects
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2012· 1 cited
EUVL defect printability: an industry challenge
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2012· 3 cited
Smoothing of substrate pits using ion beam deposition for EUV lithography
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2012· 7 cited
EUV mask multilayer defects and their printability under different multilayer deposition conditions
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2012· 15 cited
Printability of native blank defects and programmed defects and their stack structures
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2011· 47 cited
Corrigendum to “Synthesis and electroluminescent properties of blue-emitting t-butylatedbis(diarylaminoaryl)anthracenes for OLEDs” [Thin Solid Films 518 (22) (2010) 6253–6258]
Thin Solid Films·2011
Overview of Mask Metrology
AIP conference proceedings·2011· 5 cited
Native blank defect analysis for the study of printability
eScholarship (California Digital Library)·2010Open Access
Synthesis and electroluminescent properties of blue-emitting t-butylated bis(diarylaminoaryl)anthracenes for OLEDs
Thin Solid Films·2010· 26 cited
Angular Dependence of the Etch Rates of TaN in CF[sub 4]/Ar and CHF[sub 3]/Ar Plasmas
Journal of The Electrochemical Society·2008· 6 cited
Growth of Indium Nitride Crystalline on Sapphire Substrate by Microwave-Excited Metalorganic Vapor Phase Epitaxy
대한전자공학회 학술대회·1996

Frequent Co-authors

Jenah Harris-Jones(9), Ranganath Teki(6), Vibhu Jindal(6), Aaron Cordes(3), Iacopo Mochi(3), Kenneth A. Goldberg(3), Toshio Nakajima(2), Kum Hee Lee(2), Jae Nam You(2), Sunwoo Kang(2), Young Kwan Kim(2), Seung Soo Yoon(2), Patrick A. Kearney(2), Il-Yong Jang(2), Sungmin Huh(2), Chien-Chu Lin(2), Frank Goodwin(2), E. Stinzianni(2), Yuya Yamaguchi(1), Hiroo Kinoshita(1)