A. J. Craven

Materials Science · Physical Sciences

28h-index2.5kcitations161works0.02yr avg
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Research Topics

Electron and X-Ray Spectroscopy Techniques(57), Semiconductor materials and devices(54), Integrated Circuits and Semiconductor Failure Analysis(29), Advancements in Semiconductor Devices and Circuit Design(18), Advanced Electron Microscopy Techniques and Applications(18)

Publications161 total

Effects of the sputter cleaning process in cathodic arc evaporation
2022· 1 cited
A method of studying texture development in thin films on a nanometre scale
2022
TEM studies of organic pigments
2022
The use of PEELS for the study of precipitate complexes in HSLA steels
2022· 2 cited
Correction of EELS dispersion non-uniformities for improved chemical shift analysis
Ultramicroscopy·2020· 8 citedOpen Access
Chapter Twelve - Performing EELS at higher energy losses at both 80 and 200 kV
White Rose Research Online (University of Leeds, The University of Sheffield, University of York)·2019· 3 cited
EELS Analysis of Nano-Sized Particles in a Matrix
Microscopy and Microanalysis·2018· 2 citedOpen Access
Application of spectrum imaging to the study of high-k dielectric stacks
2018
TEM characterization of GaSb grown on single crystal offcut Silicon (001)
Microscopy and Microanalysis·2017Open Access
Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO<sub>3</sub>
Materials Science and Technology·2015· 7 citedOpen Access
Nanocharacterisation of precipitates in austenite high manganese steels with advanced techniques: HRSTEM and DualEELS mapping
Journal of Physics Conference Series·2014· 2 citedOpen Access
Analysing interface reactions using EELS
Journal of Physics Conference Series·2012· 1 citedOpen Access
Atomic scale structure and chemistry of anti-phase boundaries in (Bi<sub>0.85</sub>Nd<sub>0.15</sub>)(Fe<sub>0.9</sub>Ti<sub>0.1</sub>)O<sub>3</sub>ceramics
Journal of Physics Conference Series·2012· 6 citedOpen Access
Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO<sub>3</sub>ceramics co-doped with Nd and Ti
Journal of Physics Conference Series·2012Open Access
Enhanced Eshelby Twist on Thin Wurtzite InP Nanowires and Measurement of Local Crystal Rotation
Physical Review Letters·2011· 32 citedOpen Access
Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO<sub>3</sub>
Microscopy and Microanalysis·2011· 1 citedOpen Access
Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack
Microelectronic Engineering·2011· 1 cited
Evidence for molecular N2 bubble formation in a (Ga,Fe)N magnetic semiconductor
JuSER (Forschungszentrum Jülich)·2011
Characterising the surface and interior chemistry of core–shell nanoparticles using scanning transmission electron microscopy
Ultramicroscopy·2010· 7 citedOpen Access
A HAADF investigation of AlAs/GaAs interfaces using SuperSTEM
Journal of Physics Conference Series·2010· 1 citedOpen Access
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Frequent Co-authors

David W. McComb(12), Mhairi Mackenzie(10), J. A. Wilson(5), A. T. Paxton(5), T. N. Baker(4), D. Vlachos(4), L. A. J. Garvie(3), A. J. Nixon(3), Y. Li(3), D. N. Crowther(3), A.J. Pearson(3), S. Ostanin(3), F.T. Docherty(3), J. Scott(2), W. A. P. Nicholson(2), Christopher J. Ormandy(2), R.J. Wilkins(2), A. J. G. Pearson(2), Peter S. Mitchell(2), J. E. Wildermoth(2)