J C Rivière

Materials Science · Physical Sciences

26h-index2.6kcitations124works0.02yr avg
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Research Topics

Electron and X-Ray Spectroscopy Techniques(42), Ion-surface interactions and analysis(28), X-ray Spectroscopy and Fluorescence Analysis(20), Advanced Materials Characterization Techniques(15), Semiconductor materials and devices(13)

Publications124 total

Handbook of surface and interface analysis : methods for problem-solving
1998· 144 cited
Surface analysis: current capabilities
Materials Science and Technology·1993· 9 cited
Surface analysis: current capabilities
Materials Science and Technology·1993
Characterization of the annealed CoTi (110) surface and its interaction with molecular oxygen at room temperature
Surface and Interface Analysis·1992· 4 cited
Crystallographic changes in (Ca<sub><i>x</i></sub>Sr<sub>1−<i>x</i></sub>)<sub><i>n</i>+1</sub> Ti<sub><i>n</i></sub>O<sub>3<i>n</i>+1</sub> layer perovskites: XPS and XAES investigations
Journal of materials research/Pratt's guide to venture capital sources·1992· 6 cited
Recent advances in surface analysis. Invited lecture
The Analyst·1992
Dedication
1990
Photon excitation: ultra-violet photoelectron spectroscopy (UPS) and synchrotron radiation photoelectron spectroscopy (SRPS)
1990
High field excitation: atom probe field ion microscopy (APFIM)
1990
Introduction
1990
Electron excitation: electron stimulated desorption (ESD) and electron stimulated desorption ion angular distribution (ESDIAD)
1990
High field excitation: scanning tunnelling microscopy and spectroscopy (STM and STS)
1990
Thermal excitation: thermal desorption spectroscopy (TDS)
1990· 1 cited
Ion excitation: secondary neutral mass spectrometry (SNMS) and glow discharge mass spectrometry (GDMS)
1990
Preafce
1990
Ion excitation: ion neutralization spectroscopy (INS) and metastable quenching spectroscopy (MQS)
1990
Electron excitation: soft X-ray appearance potential spectroscopy (SXAPS), Auger electron appearance potential spectroscopy (AEAPS), and dis-appearance potential spectroscopy (DAPS)
1990· 1 cited
Instrumentation
1990
High field excitation: inelastic electron tunnelling spectroscopy (IETS)
1990
Resume of physical principles
1990
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Frequent Co-authors

H. E. Bishop(10), J.P. Coad(8), S. Myhra(8), J.A.A. Crossley(4), P.T. Moseley(3), Leslie Welch(3), B.J. Hopkins(2), G. Tappin(2), Erik W. Young(2), Elio Desimoni(1), Cosimino Malitesta(1), P. G. Zambonin(1), H. Netzer(1), G. Rosina(1), G. Strasser(1), J.A.D. Matthew(1), J. Barbier(1), E. Churin(1), J.M. Parera(1), Colin Shell(1)