D. F. Mitchell

Materials Science · Physical Sciences

34h-index3.2kcitations109works0.02yr avg
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Research Topics

Electron and X-Ray Spectroscopy Techniques(23), Ion-surface interactions and analysis(23), Semiconductor materials and devices(20), High-Temperature Coating Behaviors(19), Catalytic Processes in Materials Science(15)

Publications109 total

Increased Processing Options and Properties of Molybdenum 41% Rhenium as a Result of Powder Modification
2010
Manganese dioxide surface under the electron beam irradiation of X-ray photoelectron spectroscopy
Murdoch Research Repository (Murdoch University)·2006
Physical and Electrical Characterization of Thin Anodic Oxides on Si(100)
Journal of The Electrochemical Society·1995· 9 cited
Oxidation mechanisms of β-NiAl + Zr determined by SIMS
Corrosion Science·1995· 88 cited
A combined approach: Isotopic exposure/SIMS analysis/SEM to Study the Early Stages of oxidation of β‐NiAl at 1473 K
Materials and Corrosion·1995· 23 cited
Quantitative analysis of low-energy Xe+ ion bombardment damage of Si(100) surfaces using x-ray photoelectron spectroscopy
Applied Physics Letters·1994· 15 cited
Measurements of thin oxide films of SiO2/Si(100)
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms·1994· 10 cited
SIMS Studies of Alumina Growth at 1200°C
Elsevier eBooks·1994
Film thickness measurements of SiO <sub>2</sub> by XPS
Surface and Interface Analysis·1994· 160 cited
A Study of the Growth of α-Al2O3 Scales Using High-Resolution Imaging Secondary Ion Mass Spectrometry
CORROSION·1994· 51 cited
ChemInform Abstract: Growth and Characterization of Room Temperature Anodic SiO2 Films.
ChemInform·1993
The effect of yttria coatings on the oxidation behaviour of Fe-25Aland Ni-32Al at 1100 and 1200 °C
Journal de Physique IV (Proceedings)·1993· 5 citedOpen Access
Growth and Characterization of Room Temperature Anodic SiO2 Films
Journal of The Electrochemical Society·1993· 24 cited
X-ray photoelectron spectroscopy and static time-of-flight secondary ion mass spectrometry study of dispersion polymerized polystyrene latexes
Langmuir·1993· 44 cited
The growth and stability of passive films
Corrosion Science·1993· 50 cited
R.f. magnetron deposition of calcium fluoride
Thin Solid Films·1992· 23 cited
Structure of Sulphur-Passivated InP(100)-(1×1) Surface
MRS Proceedings·1992· 1 cited
HIGH-TEMPERATURE OXIDATION OF IRON-ALUMINUM ALLOYS
Elsevier eBooks·1992· 4 cited
SIMS studies of oxide growth on beta-NiAl
NASA Technical Reports Server (NASA)·1992
ChemInform Abstract: Nature of the Passive Film on Fe‐Cr Alloys as Studied by 18O Secondary Ion Mass Spectrometry: Reduction of the Prior Film and Stability to ex situ Surface Analysis.
ChemInform·1991
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Frequent Co-authors

M. J. Graham(12), G. I. Sproule(11), B. MacDougall(9), R. J. Hussey(8), M. J. Graham(8), M. J. Graham(7), J. A. Bardwell(5), P. B. Sewell(5), A. J. GORDON(5), Gilbert Ryle(5), M. Cohen(4), C. E. POWELL(4), C. M. Cotell(3), G. J. Yurek(3), K. B. Clark(2), R. Prescott(2), P. Papaiacovou(2), R. Goetz(2), J. Jung(2), Geoff Salomons(2)