Stephen Y. H. Su

Computer Science · Physical Sciences

15h-index1.4kcitations53works0.02yr avg
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Research Topics

VLSI and Analog Circuit Testing(23), Embedded Systems Design Techniques(21), VLSI and FPGA Design Techniques(13), Radiation Effects in Electronics(8), Low-power high-performance VLSI design(7)

Publications53 total

Fault-Tolerant Array Processors Via Reconfiguration of Two-Level Redundancy Arrays.
Parallel and Distributed Processing Techniques and Applications·1997
Recent development and future trends in fault testing and tolerance of VLSI systems
1992
Fault Diagnosis of Array Processors with Uniformly Distributed Faults
1989· 2 cited
An online diagnosable fault-tolerant redundancy system
Journal of Computer Science and Technology·1987
Generalized parallel signature analyzers with external exclusive-OR gates
Journal of Computer Science and Technology·1986· 1 cited
Analysis of a Class of Recovery Procedures
IEEE Transactions on Computers·1986· 42 cited
Detecting I/O and Internal Feedback Bridging Faults
IEEE Transactions on Computers·1985· 20 cited
VLSI Functional Test Pattern Generation: A Design and Implementation.
International Test Conference·1985· 8 cited
IDAS - An integrated design automation system
Managing Requirements Knowledge, International Workshop on·1984
Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique
International Test Conference·1984· 13 cited
Functional Testing Techniques for Digital LSI/VLSI Systems
Design Automation Conference·1984· 30 cited
IDAS
AFIPS conference proceedings·1984· 7 citedOpen Access
VLSI Functional Testing Using Critical Path Traces at a Hardware Description Language Level
Informatik-Fachberichte·1984· 2 cited
Functional Testing of LSI/VLSI (Very Large Scale Integration) Based Systems with Measure of Fault Coverage.
Defense Technical Information Center (DTIC)·1983
New Algorithms for Testing Instruction Decoding Function of Microprocessors
Defense Technical Information Center (DTIC)·1983
Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.
Defense Technical Information Center (DTIC)·1982
Analysis of an Important Class of Non-Markov Systems
IEEE Transactions on Reliability·1982· 11 cited
Testing Functional Faults in VLSI
Design Automation Conference·1982· 22 cited
A New Fault Model and Testing Technique for CMOS Devices.
International Test Conference·1982· 200 cited
Testing functional faults in VLSI
Proceedings of the nineteenth design automation conference on - DAC '82·1982· 10 citedOpen Access
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Frequent Co-authors

Yashwant K. Malaiya(5), Peter T. Cheung(4), Tonysheng Lin(3), Yinghua Min(2), Melvin A. Breuer(2), Mehmet Baray(2), Mark G. Karpovsky(2), Richard Spillman(2), Robert L. Carberry(2), Minghsien Wang(2), S.H. Unger(1), H. Y. Chang(1), E. G. Manning(1), Gernot Metze(1), Edgar Ducasse(1), Z.G. Vranesic(1), William I. Fletcher(1), Grant E. Eastman(1), Charles W. Johnson(1), David C. Rine(1)