Toshio Sakurai Toshio Sakurai

Tohoku University — Japan

Physics and Astronomy · Physical Sciences

13h-index568citations18works0.02yr avg
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Research Topics

Surface and Thin Film Phenomena(12), Advanced Materials Characterization Techniques(6), Graphene research and applications(4), Force Microscopy Techniques and Applications(4), Fullerene Chemistry and Applications(4)

Publications18 total

Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis
Japanese Journal of Applied Physics·1998· 12 cited
Initial Stages of Cubic GaN Growth on the GaAs(001) Surface Studied by Scanning Tunneling Microscopy
Japanese Journal of Applied Physics·1997· 21 cited
An Observation of Benzotriazole (BTA) Adsorption on Cu(110) by the Ultra High Vacuum (UHV)-Scanning Tunneling Microscope (STM) and Low Energy Electron Difiraction (LEED)
Japanese Journal of Applied Physics·1994· 24 cited
The Absolute Coverage of K on the Si(111)-3×1-K Surface
Japanese Journal of Applied Physics·1993· 45 cited
Field Ion-Scanning Tunneling Microscopy of Metallofullerenes Adsorbed on the Si(100)2×1 Surface
Japanese Journal of Applied Physics·1993· 23 cited
Ordering of Missing-Row-Defects Forming (2×n)-Bi Phases on the Si(100) 2×1 Surface Studied by the Scanning Tunneling Microscopy
Japanese Journal of Applied Physics·1993· 30 cited
GaAs(100) (2×4) Surface Study by Molecular Beam Epitaxy and Field-Ion-Scanning-Tunneling-Microscopy
Japanese Journal of Applied Physics·1993· 22 cited
C<sub>60</sub> Grown on the Cu(111)1×1 Surface
Japanese Journal of Applied Physics·1993· 75 cited
Coverage-Dependent Growth Structures of Sodium on the GaAs(110) Surface
Japanese Journal of Applied Physics·1993· 3 cited
Adsorption Structure of the Na-Saturated Si(100)2×1 Surface Studied by Field-Ion Scanning Tunneling Microscopy/Spectroscopy
Japanese Journal of Applied Physics·1993· 9 cited
Structure of the Bi/Si(111) Surface by Field-Ion Scanning Tunneling Microscopy
Japanese Journal of Applied Physics·1993· 12 cited
Scanning Tunneling Microscopy of √3×√3-Bi Reconstruction on the Si(111) Surface
Japanese Journal of Applied Physics·1993· 20 cited
Field Ion-Scanning Tunneling Microscopy Study of C<sub>84</sub> on the Si(100) Surface
Japanese Journal of Applied Physics·1993· 21 cited
Adsorption of Na on the GaAs(110) Surface Studied by the Field-Ion-Scanning-Tunneling-Microscopy
Japanese Journal of Applied Physics·1992· 20 cited
Field Ion-Scanning Tunneling Microscopy Study of Sulfur/Chlorine Adsorption on the Cu(111) 1×1 Surface
Japanese Journal of Applied Physics·1992· 5 cited
Field Ion-Scanning Tunneling Microscopy Study of C<sub>60</sub> on the Si(100) Surface
Japanese Journal of Applied Physics·1992· 152 cited
Scanning Tunneling Microscope Study of the Structural Transformation of the Si(111)7×7 Surface to the Na-Induced 3×1 Surface
Japanese Journal of Applied Physics·1992· 17 cited
Field Ion-Scanning Tunneling Microscopy Study of the Ag(110)-O System
Japanese Journal of Applied Physics·1991· 57 cited

Frequent Co-authors

Tomihiro Hashizume(11), Kumi Motai(5), Tomihiro Hashizume Tomihiro Hashizume(5), Yūichirō Nishina(4), Hisanori Shinohara(4), Yahachi Saito(4), Dongryul Jeon(3), Chunli Bai(3), Dong-Ryul Jeon Dong-Ryul Jeon(3), Xiang-Dong Wang(2), Howard W. Pickering(2), Hua Lü(2), Ken‐ichi Tanaka(2), Yukio Hasegawa(2), Raouf Z. Bakhtizin(2), Young Kuk(1), Masahiro Taniguchi(1), Mitsuhiro Katayama(1), Masakazu Aono(1), Chan Park(1)