A.P. Ambler

Computer Science · Physical Sciences

15h-index1.3kcitations72works0.02yr avg
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Research Topics

VLSI and Analog Circuit Testing(28), Engineering and Test Systems(17), Integrated Circuits and Semiconductor Failure Analysis(17), VLSI and FPGA Design Techniques(8), Manufacturing Process and Optimization(7)

Publications72 total

Economics of Design and Test
2025
Association between genetic and socioenvironmental risk for schizophrenia during upbringing in a UK longitudinal cohort
Psychological Medicine·2020· 37 citedOpen Access
Insomnia and children's family socialization environments.
Goldsmiths (University of London)·2012· 1 cited
A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System
2009· 5 cited
The Report Committee for Andrew Harman Frisch
2009
Power efficiency system for flight application (pesfa) mission
IEEE Transactions on Aerospace and Electronic Systems·2006· 12 cited
Behavioral Test Economics
Proceedings/Proceedings - International Test Conference·2006· 9 cited
Cost Effective Test Planning for System-on-Chip Manufacture
Conference record (1995) - Autotestcon/Conference record - Autotestcon·2006· 8 cited
Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System
Lecture notes in computer science·2006· 6 cited
A STEADY-STATE RESPONSE TEST GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS
2005· 5 cited
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume
2005
Reduction of Power and Test Time by Removing Cluster of Don’t-Care from Test Data Set
2005· 1 cited
Dynamic cmos circuit power dissipation methodology in low power high bandwidth chip design
Texas ScholarWorks (Texas Digital Library)·2004
System manufacturing test cost model
2003· 15 cited
Test strategy planning method for complex integrated circuits
2003· 1 cited
Is it rocket science?
2003
A new multiprocessor interconnection network with wide sense nonblocking capabilities
2003· 4 cited
Cost analysis of test method environments
2003· 26 cited
Hierarchical testability measurement and design for test selection by cost prediction
2003· 3 cited
Algorithms for cost optimised test strategy selection
2002· 9 cited
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Frequent Co-authors

Ian Dear(11), C. Dislis(11), Jochen Dick(9), R. J. Popplestone(8), Harry G. Barrow(3), Calum M. Brown(3), R. M. Burstall(3), J.R. Miles(3), S.C. Lau(3), Taikyeong Jeong(3), I.M. Bellos(2), P. Varma(2), K.D. Baker(2), Louise Arseneault(2), Avshalom Caspi(2), Terrie E. Moffitt(2), D. Farren(2), E. Trischler(2), Songjun Lee(2), Seraphin Calo(2)