C. M. Demanet

Engineering · Physical Sciences

9h-index263citations29works0.02yr avg
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Research Topics

Ion-surface interactions and analysis(11), Force Microscopy Techniques and Applications(9), Electron and X-Ray Spectroscopy Techniques(9), Integrated Circuits and Semiconductor Failure Analysis(9), Semiconductor materials and devices(5)

Publications29 total

Characterization of the acoustic attenuation index of perforated plasterboard ceilings and lining wall and comparison with an empirical model
NOISE-CON proceedings·2024
A floating spherical gaussian orbital model for polymers: I. general formalism and computational procedure
International Journal of Quantum Chemistry·2009· 11 cited
Atomic force microscopy and high-resolution RBS investigation of the surface modification of magnetron sputter-etched Si(111) in an argon plasma at different pressures
Surface and Interface Analysis·1999· 1 cited
The Effect of Elastic Relaxation on the Indentation Size Effect in Tungsten Carbide
Journal of Materials Science Letters·1999· 8 cited
Atomic force microscopy study of Si(111) surface morphology and electrical characteristics of Pd/n-Si schottky diodes: effect of cleaning procedures
Surface and Interface Analysis·1998· 4 cited
Scanning force microscopy investigation of ion bombarded InP
Applied Surface Science·1998· 5 cited
Using scanning force microscopy (SFM) to investigate various cleaning procedures of different transparent conducting oxide substrates
Applied Surface Science·1998· 10 cited
Applications of atomic force microscopy
South African Journal of Science·1997Open Access
Atomic Force Microscopy Investigation of Noble Gas Ion Bombardment on InP: Effect of Ion Energy
Surface and Interface Analysis·1996· 24 cited
Atomic force microscopy investigation of ion-bombarded InP: Effect of angle of ion bombardment
Surface and Interface Analysis·1996· 1 cited
Atomic force microscopy images of a pollen grain: A preliminary study
South African Journal of Botany·1996· 3 citedOpen Access
Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment
Surface and Interface Analysis·1996· 21 cited
The surface topography of an ion milled WC-Co sample
Journal of Materials Science Letters·1996· 1 cited
Atomic force microscopy investigation of argon‐bombarded InP: Effect of ion dose density
Surface and Interface Analysis·1995· 45 cited
Atomic force microscopy determination of the topography of fly-ash particles
Applied Surface Science·1995· 17 cited
Scanning force microscopy analysis of the surface of ion‐irradiated diamond
Surface and Interface Analysis·1995· 3 cited
XPS as a tool for the investigation of polymers irradiated by energetic ions
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms·1988· 19 cited
Modifications induced in polyvinylidene fluoride by energetic ions
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms·1988· 46 cited
Diffusion of Cr dopant from substrate GaAs into LPE grown epilayers
Surface and Interface Analysis·1986
SIMS analysis of evaporated indium contacts on (HgCd)Te
Applied Surface Science·1986· 2 cited
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Frequent Co-authors

J.B. Malherbe(4), K. Vijaya Sankar(4), K.T. Hillie(3), A. Le Moël(2), J. P. Duraud(2), N.G. van der Berg(2), Mario Marais(2), F.D. Auret(2), S. Luyckx(2), Prakash N. K. Deenapanray(2), S. Shrivastava(2), J.G.H. Du Preez(2), H.J. Strydom(2), C.M. Stander(2), C. Lecomte(1), M.T. Valin(1), M. Henriot(1), C. Le Gressus(1), C. Darnez(1), E. Balanzat(1)