S.G. Chamberlain

Engineering · Physical Sciences

21h-index1.5kcitations136works0.02yr avg
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Research Topics

CCD and CMOS Imaging Sensors(56), Infrared Target Detection Methodologies(35), Advancements in Semiconductor Devices and Circuit Design(34), Thin-Film Transistor Technologies(34), Semiconductor materials and devices(33)

Publications136 total

Machine model ESD tester for enhanced capacitor reliability
2009· 1 cited
Mega pixel CCD image sensor technology
2002· 3 cited
A large dynamic range photodetector array for acousto-optic spectrum analyzers
2002
Compact SPICE modeling and design optimization of low leakage a-Si:H TFTs for large-area imaging systems
2002· 2 cited
Monte Carlo simulation of electron transport in amorphous silicon Schottky diodes
2002
a-Si:H Schottky diode direct detection pixel for large area X-ray imaging
2002· 13 cited
High resolution tri-linear colour TDI CCD image sensor with programmable responsivity gain
2002· 4 cited
An analytical model for a-Si:H transistors based on TFT device characteristics
2002· 2 cited
An architecture for integrated reliability simulators using analog hardware description languages
2002· 6 cited
High performance a-Si:H thin film transistors based on aluminum gate metallization
Microelectronics Reliability·2000· 13 cited
Optimization of n+μc-Si:H contact layer for low leakage current in a-Si:H thin film transistors
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·2000· 12 cited
a‐Si:H薄膜トランジスタの安定性と漏れ電流におよぼす最上層窒化層の役割
1999
Fabrication of a-Si:H Tfts at 120°C on Flexible Polyimide Substrates
MRS Proceedings·1999· 9 cited
Effect of deposition temperature on the structural properties of n+ μc-Si:H films
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1998· 9 cited
Process Integration of A-Si:H Schottky Diode and thin Film Transistor for Low-Energy X-Ray Imaging Applications
MRS Proceedings·1998· 9 cited
Improvement of the reliability of amorphous silicon transistors by conduction-band tail width reduction
IEEE Transactions on Electron Devices·1998· 4 cited
Thick-layered etched-contact amorphous silicon transistors
IEEE Transactions on Electron Devices·1998· 12 cited
Compact Spice Modeling and Design Optimization of Low Leakage a-Si:H TFTs for Large-Area Imaging Systems
MRS Proceedings·1998· 10 cited
A comparison of the performance and reliability of wet-etched and dry-etched a-Si:H TFTs
IEEE Transactions on Electron Devices·1998· 13 cited
Effect of Nh<sub>3</sub>/SiH<sub>4</sub> Gas Ratios of Top Nitride Layer on Stability and Leakage in a-Si:H Thin Film Transistors
MRS Proceedings·1998· 12 cited
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Frequent Co-authors

Arokia Nathan(8), D.J. Roulston(7), R.V.R. Murthy(7), S.M. GadelRab(5), M.J. Van der Tol(3), A. Husain(3), Neha Arora(2), G.A. Kerkut(2), A.M. Miri(2), M.H. Elsaid(2), John McMacken(2), James W. Roberts(2), Porter Jenkins(2), D.B. Scott(2), William D. Washkurak(2), Koorosh Aflatooni(2), Richard Hornsey(2), B. Park(2), Andrei Sazonov(2), J.P.Y. Lee(1)