Nian Zhan

Chongqing University of Posts and Telecommunications — China

Engineering · Physical Sciences

6h-index263citations14works0.02yr avg
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Research Topics

Semiconductor materials and devices(13), Advancements in Semiconductor Devices and Circuit Design(12), Integrated Circuits and Semiconductor Failure Analysis(8), Ferroelectric and Negative Capacitance Devices(4), Multi-Criteria Decision Making(1)

Publications14 total

A novel superiority and inferiority ranking method for engineering investment selection under interval-valued intuitionistic fuzzy environment
Journal of Intelligent & Fuzzy Systems·2019· 13 cited
Dielectric breakdown characteristics and interface trapping of hafnium oxide films
Microelectronics Journal·2004· 22 cited
Dielectric breakdown characteristics and interface trapping of hafnium oxide films
2004· 2 cited
Effects of rapid thermal annealing on the interface and oxide trap distributions in hafnium oxide films
2004· 3 cited
Charge trapping and stress-induced dielectric breakdown characteristics of HfO/sub 2/ films
2004
Interface and oxide traps in high-κ hafnium oxide films
Thin Solid Films·2004· 48 cited
Interface bonding structure of hafnium oxide prepared by direct sputtering of hafnium in oxygen
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2004· 61 cited
Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing
Microelectronics Reliability·2003· 25 cited
Electrical characteristics of novel hafnium oxide film
2003
Characteristics of high quality hafnium oxide gate dielectric
2003· 3 cited
XPS Study of the Thermal Instability of HfO[sub 2] Prepared by Hf Sputtering in Oxygen with RTA
Journal of The Electrochemical Society·2003· 86 cited
Fabrication and characterization of hafnium oxide films prepared by direct sputtering
2003
High Quality HfO<sub>2</sub> Film and Its Applications in Novel Poly-Si Devices
MRS Proceedings·2002
Grain Quality Enhancement of Nickel-Crystallized Polysilicon Film in Quantum-Wire-Like Structures
MRS Proceedings·2001

Frequent Co-authors

M.C. Poon(12), Chi‐Wah Kok(11), K.L. Ng(11), Hei Wong(11), Mansun Chan(4), Jie Jian(1), Jiafu Su(1), V. Filip(1), Hongmei Wang(1), S. Jagar(1), C.F. Cheng(1)