E.A. Stach

Purdue University West Lafayette — United States

Engineering · Physical Sciences

22h-index2.0kcitations44works0.02yr avg
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Research Topics

Advanced Surface Polishing Techniques(17), Metal and Thin Film Mechanics(11), Semiconductor materials and devices(10), Force Microscopy Techniques and Applications(8), Advanced MEMS and NEMS Technologies(7)

Publications44 total

The effects of cubic stiffness on fatigue characterization resonator performance
Sensors and Actuators A Physical·2009· 10 cited
0.8-V Supply Voltage Deep-Submicrometer Inversion-Mode $\hbox{In}_{0.75}\hbox{Ga}_{0.25}\hbox{As}$ MOSFET
IEEE Electron Device Letters·2009· 93 citedOpen Access
Tribological behavior of micron-scale polycrystalline silicon structural films in ambient air
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 1 cited
Micron-Scale Friction and Sliding Wear of Polycrystalline Silicon Thin Structural Films in Ambient Air
Journal of Microelectromechanical Systems·2008· 48 cited
Effect of post-release sidewall morphology on the fracture and fatigue properties of polycrystalline silicon structural films
Sensors and Actuators A Physical·2008· 31 cited
Further considerations on the high-cycle fatigue of micron-scale polycrystalline silicon
Scripta Materialia·2008· 41 cited
Corrigendum to “Ultrastructural examination of dentin using focused ion-beam cross-sectioning and transmission electron microscopy” [Micron 36 (7–8) (2005) 672–680]
Micron·2007
Very high-cycle fatigue failure in micron-scale polycrystalline silicon films: Effects of environment and surface oxide thickness
Journal of Applied Physics·2007· 63 citedOpen Access
Using EELS to observe composition and electronic structure variations at dislocation cores in GaN
The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics·2006· 18 cited
Size effects in the nanoindentation of silicon at ambient temperature
The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics·2006· 35 cited
An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air
Thin Solid Films·2006· 40 cited
Ultrastructural examination of dentin using focused ion-beam cross-sectioning and transmission electron microscopy
Micron·2005· 108 cited
Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films
Journal of Materials Science·2005· 3 citedOpen Access
Fatigue failure in thin-film polycrystalline silicon is due to subcritical cracking within the oxide layer
Applied Physics Letters·2005· 50 citedOpen Access
Dislocation–grain boundary interactions in martensitic steel observed through in situ nanoindentation in a transmission electron microscope
Journal of materials research/Pratt's guide to venture capital sources·2004· 144 cited
Effects of solute Mg on grain boundary and dislocation dynamics during nanoindentation of Al–Mg thin films
Acta Materialia·2004· 143 citedOpen Access
Direct observation of deformation-induced grain growth during the nanoindentation of ultrafine-grained Al at room temperature
Acta Materialia·2004· 378 cited
Characteristic dimensions and the micro-mechanisms of fracture and fatigue in `nano' and `bio' materials
International Journal of Fracture·2004· 42 cited
Investigation of Femtosecond Laser-assisted Micromachining of Lithium Niobate
CIRP Annals·2004· 20 cited
Utilizing On-Chip Testing and Electron Microscopy to Study Fatigue and Wear in Polysilicon Structural Films
MRS Proceedings·2004· 3 cited
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Frequent Co-authors

Robert O. Ritchie(20), Christopher L. Muhlstein(12), Daan Hein Alsem(9), Andrew M. Minor(7), J. W. Morris(7), J. Th. M. De Hosson(4), R.K. Nalla(4), Velimir Radmilović(4), Michael T. Dugger(4), Erica T. Lilleodden(3), R. Hull(3), Alexandra E. Porter(2), A. M. Minor(2), Antoni P. Tomsia(2), Brad Boyce(2), J. C. Bean(2), Ajay P. Malshe(2), Devesh C. Deshpande(2), Dennis R. Alexander(2), U. Dahmen(2)