Agilent Technologies (United States) — United States
Engineering · Physical Sciences
14h-index609citations24works0.02yr avg
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Research Topics
Advancements in Photolithography Techniques(15), Electron and X-Ray Spectroscopy Techniques(13), Surface and Thin Film Phenomena(7), Advanced Electron Microscopy Techniques and Applications(5), Nanofabrication and Lithography Techniques(5)
Publications24 total
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena·2010
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 3 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2007· 9 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2006· 14 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2006· 20 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2006· 15 cited
Microelectronic Engineering·2001· 122 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2000· 51 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2000· 11 cited
Microelectronic Engineering·2000· 16 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1993· 24 cited
Microelectronic Engineering·1993· 4 cited
Japanese Journal of Applied Physics·1992· 18 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1992· 89 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1992· 14 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1991· 22 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1991· 13 cited
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Frequent Co-authors
T. H. P. Chang(13), D. P. Kern(11), J. P. Spallas(9), U. Staufer(7), C. S. Silver(6), Marián Maňkoš(4), C. Stebler(3), Yautzong Hsu(3), Max Gmür(2), T. H. P. Chang(2), Kim Y. Lee(1), K. Lee(1), Mingxu Yang(1), Peter W. Jacobs(1), Chankeun Yoon(1), Esther M. Anderson(1), David Attwood(1), Gábor A. Somorjai(1), Hae Soung Kim(1), Mingzhu Yu(1)