Chandu Visweswariah

IBM (United States) — United States

Engineering · Physical Sciences

19h-index1.2kcitations59works0.02yr avg
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Research Topics

Low-power high-performance VLSI design(44), VLSI and FPGA Design Techniques(39), VLSI and Analog Circuit Testing(31), Embedded Systems Design Techniques(12), Analog and Mixed-Signal Circuit Design(7)

Publications59 total

Preface: Smarter Energy
IBM Journal of Research and Development·2016· 1 citedOpen Access
Order statistics for correlated random variables and its application to at-speed testing
ACM Transactions on Design Automation of Electronic Systems·2013· 5 cited
Speeding up computation of the max/min of a set of gaussians for statistical timing analysis and optimization
2013· 1 cited
Transistor sizing of custom high-performance digital circuits with parametric yield considerations
Optimization and Engineering·2013· 8 cited
A dynamic method for efficient random mismatch characterization of standard cells
2012· 4 cited
A Novel Method for Reducing Metal Variation With Statistical Static Timing Analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2012· 3 cited
Timing analysis with nonseparable statistical and deterministic variations
2012· 6 cited
Reversible statistical <i>max/min</i> operation
2012· 7 cited
Reversible Statistical max/min Operation: Theory and Applications to Timing
2012· 1 cited
Transistor sizing of custom high-performance digital circuits with parametric yield considerations
2010· 15 cited
Session details: Statistical techniques for silicon-to-model correlation
2010
Statistical Path Selection for At-Speed Test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems·2010· 42 cited
A New Methodology for Power-Aware Transistor Sizing: Free Power Recovery (FPR)
Lecture notes in computer science·2010
Pre-ATPG path selection for near optimal post-ATPG process space coverage
2009· 11 cited
Voltage binning under process variation
2009· 29 cited
Efficient modeling of spatial correlations for parameterized statistical static timing analysis
2009· 3 cited
A moment-based effective characterization waveform for static timing analysis
2009· 5 cited
Statistical ordering of correlated timing quantities and its application for path ranking
2009· 7 cited
Statistical multilayer process space coverage for at-speed test
2009· 25 cited
Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations
2009
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Frequent Co-authors

Vladimir Zolotov(24), Jinjun Xiong(24), N. Venkateswaran(4), Andrew R. Conn(4), R.A. Haring(4), Andrew R. Conn(4), Peter Habitz(4), Debjit Sinha(4), Hanif Fatemi(3), Xiaoliang Bai(2), Philip N. Strenski(2), P. Coulman(2), Gregory L. Morrill(2), Yiyu Shi(2), Ruimin Chen(2), Lizheng Zhang(2), Daniel K. Beece(2), Eric A. Foreman(2), Howard Chen(2), Scott Neely(2)