D. T. Shi

Harbin Institute of Technology — China

Engineering · Physical Sciences

7h-index243citations23works11.52yr avg
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Research Topics

Advanced Semiconductor Detectors and Materials(8), Silicon Carbide Semiconductor Technologies(7), Semiconductor materials and interfaces(6), Semiconductor materials and devices(4), Copper Interconnects and Reliability(4)

Publications23 total

A new insight on the thermal resistance source of diamond -SiC interface: Based on non-equilibrium molecular dynamics
Journal of Materials Research and Technology·2025· 2 citedOpen Access
A diffusion-controlled kinetic model for binder burnout in a green part fabricated by binder jetting based on the thermal decomposition kinetics of TEG-DMA
Additive manufacturing·2025· 21 cited
Shear-wave splitting study in Northeastern Tibet
AGU Fall Meeting Abstracts·2010
RF property characterization of single domain YBa2Cu3Ox
2003
<title>Evaluation of NH<formula><inf><roman>4</roman></inf></formula>F/H<formula><inf><roman>2</roman></inf></formula>O<formula><inf><roman>2</roman></inf></formula> effectiveness as a surface passivation agent for Cd<formula><inf><roman>1-x</roman></inf></formula>Zn<formula><inf><roman>x</roman></inf></formula>Te crystals</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2000· 31 cited
A Surface/Interfacial Structural Model of Pd Ultra-thin Film on SiC at Elevated Temperatures
Materials science forum·2000
Comparison of morphology and interfacial composition of Pd ultrathin films on 6H–SiC and 4H–SiC at different annealing temperatures
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1999· 15 cited
Characterization of metal contacts on and surfaces of cadmium zinc telluride
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment·1999· 37 cited
Carbon and Silicon Related Surface Compounds of Palladium Ultrathin Films on SiC After Different Annealing Temperatures
MRS Proceedings·1999
Deterioration of Metal/SiC Contacts under Shear Stress from Annealing
APS Southeastern Section Meeting Abstracts·1998
Oxygen Impurities and Defects in Epitaxial Layer SiC and SiC Wafer Characterized by Room and Low Temperatures FTIR
NASA University Research Centers Technical Advances in Aeronautics, Space Sciences and Technology, Earth Systems Sciences, Global Hydrology, and Education·1998
Temperature Dependence of Diffusion and Reaction at a Pd/SiC Contact
NASA University Research Centers Technical Advances in Aeronautics, Space Sciences and Technology, Earth Systems Sciences, Global Hydrology, and Education·1998
"Un-annealed and Annealed Pd Ultra-Thin Film on SiC Characterized by Scanning Probe Microscopy and X-ray Photoelectron Spectroscopy"
NASA University Research Centers Technical Advances in Aeronautics, Space Sciences and Technology, Earth Systems Sciences, Global Hydrology, and Education·1998
The Effect of Thermal Annealing of Au Contacts on 6h-Sic and 4h-Sic
MRS Proceedings·1998· 2 cited
Interfacial Diffusion/Reaction and Electrical Properties of Pd Ultra-Thin Film on Sic at Different Annealing Temperatures
MRS Proceedings·1998
XPS/AES Study of Electrical and Chemical Properties of Pd/SiC Interface
APS Southeastern Section Meeting Abstracts·1997
Surface Morphology and Compositions for Pd/SiC by Scanning Probe Microscopy and X-ray Photoelectron Spectroscopy
APS·1997
<title>Recent CdZnTe detector fabrication developments</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1997· 4 cited
Investigation of electrical contacts for Cd/sub 1-x/Zn/sub x/Te nuclear radiation detector
IEEE Transactions on Nuclear Science·1997· 43 cited
Study of oxidized cadmium zinc telluride surfaces
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1997· 68 cited
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Frequent Co-authors

W. E. Collins(18), A. Bürger(13), R. B. James(6), W. Lu(5), Kuo‐Tong Chen(4), E. Bryant(4), K. Elshot(4), K. Lafate(4), M. A. George(3), H. Chen(3), Henry Chen(3), A. Burger(3), K.-T. Chen(2), J. Tong(2), Carl M. Stahle(2), Lyle M. Bartlett(2), S. H. Morgan(2), Kunlong Zhao(2), Zhijie Ye(2), Xiaobin Hao(2)