New York Institute of Technology — United States
Computer Science · Physical Sciences
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Research Topics
Optical measurement and interference techniques(9), Advanced Fluorescence Microscopy Techniques(8), Force Microscopy Techniques and Applications(8), Digital Holography and Microscopy(7), Advanced Measurement and Metrology Techniques(6)
Publications55 total
Frequent Co-authors
Peng Wu(6), James H. Andrews(6), Hao Jiang(4), Erdinç Atılgan(4), Haleh Alimohamadi(4), Padmini Rangamani(4), David G. Fischer(4), Steven J. Eppell(4), John Khaydarov(4), Brian P. English(3), Gareth H. McKinley(3), Aimé López Aguilar(3), Ashley Monaco(3), Josephine Axis(3), Kurt Amsler(3), Robert H. Singer(2), Pirouz Kavehpour(2), Rachel B. Hazan(2), Steven H. Izen(2), Lu Meng(2)